An experiment with electronic waste for improving the performance of FSSs embedded multilayer microwave absorber

Microwave absorbers play an essential role in the current explosion of developing electronic technology for stealth applications. Various researchers are continuously making tremendous efforts to fulfill the demand for highly efficient microwave absorbers with broad bandwidth, reasonable thickness,...

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Bibliographic Details
Published in:Journal of materials science. Materials in electronics 2023-03, Vol.34 (8), p.737, Article 737
Main Authors: Verma, Anshika, Narang, Naina, Singh, Dharmendra, Varma, G. D.
Format: Article
Language:English
Subjects:
Bandwidths
Characterization and Evaluation of Materials
Chemistry and Materials Science
Electromagnetic interference
Electromagnetic shielding
Electronic waste
Frequency selective surfaces
Materials Science
Microwave absorbers
Microwave absorption
Multilayers
Optical and Electronic Materials
Parametric analysis
Stealth technology
Thickness
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Summary:Microwave absorbers play an essential role in the current explosion of developing electronic technology for stealth applications. Various researchers are continuously making tremendous efforts to fulfill the demand for highly efficient microwave absorbers with broad bandwidth, reasonable thickness, less complex structure, and inexpensive. However, the experiment with electronic waste (e-waste) using electromagnetic (EM) techniques is still not explored so much. The main objective of this paper is to develop such a structure using e-waste and EM techniques which should have considerable thickness and good microwave absorption. Here, the possibility of multilayer using some e-waste composites has been explored, which should have broader bandwidth and affordable thickness. Further, an attempt has been made using parametric analysis to optimize simpler frequency selective surfaces (FSSs) to enhance the bandwidth while maintaining reasonable thickness. The result provides a wide bandwidth response of 11.5 GHz (for Reflection loss (RL) 
ISSN:0957-4522
1573-482X
DOI:10.1007/s10854-023-10080-y