X-ray—A boon for elemental analysis

The characteristic X-rays coming out from an unknown sample due to the irradiation of gamma rays or X-ray photons or due to the bombardment of high velocity protons are used for elemental analysis in a sample. We describe here two techniques viz., Energy Dispersive X-Ray Fluorescence (EDXRF) and Pro...

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Bibliographic Details
Published in:Resonance 2005-06, Vol.10 (6), p.60-69
Main Authors: Sharat Singh, N K, Nandakumar Sarma, H
Format: Article
Language:English
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Summary:The characteristic X-rays coming out from an unknown sample due to the irradiation of gamma rays or X-ray photons or due to the bombardment of high velocity protons are used for elemental analysis in a sample. We describe here two techniques viz., Energy Dispersive X-Ray Fluorescence (EDXRF) and Proton Induced X-ray Emission (PIXE) which have the capability of nondestructive and multi-elemental analysis of the sample.
ISSN:0971-8044
0973-712X
DOI:10.1007/BF02895795