Elastic-stress-induced phase transformations in CdSxTe1-x films

Phase transformations in CdSxTe1-x layers deposited under highly nonequilibrium conditions were studied. The dark current and photocurrent were measured as a function of temperature both in the course of and after the phase transformations. The results of electrical measurements were contrasted with...

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Bibliographic Details
Published in:Inorganic materials 2000-08, Vol.36 (8), p.762-764
Main Authors: Belyaev, A P, Rubets, V P, Kalinkin, I P
Format: Article
Language:English
Subjects:
Dark current
Electrical measurement
Electron diffraction
Nonequilibrium conditions
Phase transitions
Photoelectric effect
Solid solutions
Online Access:Get full text
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Summary:Phase transformations in CdSxTe1-x layers deposited under highly nonequilibrium conditions were studied. The dark current and photocurrent were measured as a function of temperature both in the course of and after the phase transformations. The results of electrical measurements were contrasted with electron diffraction data. The observed temperature variation of conductivity during the thermally activated decomposition of the metastable solid solutions was shown to be consistent with the position of the Fermi level and electronic density of states.
ISSN:0020-1685
1608-3172
DOI:10.1007/BF02758593