A new microwave dielectric ceramic TmVO4 with high-quality factor and the effect of TiO2 on its microwave dielectric properties

• Published in: Journal of materials science. Materials in electronics 2023-03, Vol.34 (9), p.828, Article 828
• Main Authors: Chen, Zhuting, Zheng, Yuxin, Li, Bo
• Format: Article
• Language: English
• Subjects: Ceramics; Characterization and Evaluation of Materials; Chemistry and Materials Science; Crystal structure; Crystallization; Densification; Density; Dielectric properties; Grain size; Materials Science; Optical and Electronic Materials; Raman spectra; Scanning electron microscopy; Sintering; Specific gravity; Spectrum analysis; Temperature; Titanium dioxide; Vibration mode; Zircon
• ISSN: 0957-4522; 1573-482X
• DOI: 10.1007/s10854-023-10254-8

A new microwave dielectric ceramic TmVO 4 was prepared via a solid-state reaction method. The phase formation and microstructure of TmVO 4 ceramics were investigated in detail. Rietveld refinements and TEM analysis reveal that TmVO 4 is crystallized as a tetragonal zircon-type structure with the space group I4 1 /amd. Vibrational modes of TmVO 4 were also studied via Raman spectra. Moreover, the influence of relative density and ionic polarizability on the permittivity was discussed. TmVO 4 ceramic possessed high densification and good microwave dielectric properties: ε r  = 11.95, Q  ×  f  = 53,594 GHz, and τ f  = − 40.4 ppm/°C at 1200 °C. The influence of TiO 2 on the microwave dielectric properties of TmVO 4 was investigated, with the addition of 7wt% TiO 2 , the ceramic sintered at 1250 °C showed a near to zero τ f value (2.7 ppm/°C).