Optical Properties and Electronic Characteristics of Polycrystalline and Amorphous Thin Films of the Al4Sm Alloy

The optical properties and electronic characteristics of x-ray amorphous and polycrystalline Al 4 Sm alloy films obtained by vacuum thermal evaporation were studied. The optical constants were measured by the Beatty ellipsometry method in the range 0.248–7.002 μm. The dispersion dependences of the l...

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Bibliographic Details
Published in:Journal of applied spectroscopy 2023-03, Vol.90 (1), p.29-37
Main Authors: Akashev, L. A., Popov, N. A., Makhnev, A. A., Vorontsova, E. S., Shevchenko, V. G.
Format: Article
Language:English
Subjects:
Analytical Chemistry
Atomic/Molecular Structure and Spectra
Crystal structure
Electronic properties
Ellipsometry
Optical properties
Physics
Physics and Astronomy
Polycrystals
Thin films
Vacuum thermal evaporation
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Summary:The optical properties and electronic characteristics of x-ray amorphous and polycrystalline Al 4 Sm alloy films obtained by vacuum thermal evaporation were studied. The optical constants were measured by the Beatty ellipsometry method in the range 0.248–7.002 μm. The dispersion dependences of the light conductivity σ, reflectivity R, imaginary and real parts of the dielectric permittivity ε 1 and ε 2 , and characteristic electron energy loss functions Im(ε) –1 were calculated from the spectral dependences of the optical constants. The crystal structure of the alloys was shown to affect features of their optical spectra. The electronic characteristics of these alloys were calculated from measurements in the IR spectral region using the two-band conductivity model.
ISSN:0021-9037
1573-8647
DOI:10.1007/s10812-023-01498-7