Laser-induced X-ray fluorescence and electron-based X-ray emission analysis of multi-layer material

In this study, we analyzed the X-ray fluorescence of the multi-layer material with a laser-induced X-ray and electrons. The laser plasma-based sources were generated by the femtosecond Ti: sapphire laser source, and we optimized sources for the X-ray fluorescence measurement. The laser-induced X-ray...

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Bibliographic Details
Published in:Applied physics. B, Lasers and optics Lasers and optics, 2023-04, Vol.129 (4), Article 61
Main Authors: Kang, Jungu, Ko, Do-Kyeong
Format: Article
Language:English
Subjects:
Applied physics
Coins
Electrons
Emission analysis
Engineering
Laser plasmas
Lasers
Multilayers
Optical Devices
Optics
Penetration depth
Photonics
Physical Chemistry
Physics
Physics and Astronomy
Quantum Optics
Sapphire
Stainless steels
X ray fluorescence analysis
X ray sources
X-rays
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Summary:In this study, we analyzed the X-ray fluorescence of the multi-layer material with a laser-induced X-ray and electrons. The laser plasma-based sources were generated by the femtosecond Ti: sapphire laser source, and we optimized sources for the X-ray fluorescence measurement. The laser-induced X-ray fluorescence of three types of stainless steel, copper-covered stainless steel and three types of Korean 10 Won coins were measured using a compact laser with relatively low intensity. Using the difference in penetration depth between X-rays and electrons, the surface and interior of multi-layer materials can be analyzed simultaneously. By combining these two complementary sources, we can provide valuable information about the surface and interior of multi-layer materials even with the compact laser.
ISSN:0946-2171
1432-0649
DOI:10.1007/s00340-023-08011-0