Measurement of femtosecond dynamics of ultrafast electron beams through terahertz compression and time-stamping

Visualizing ultrafast dynamics at the atomic scale requires time-resolved characterization with femtosecond temporal resolution. For fully relativistic electron bunch probes, existing techniques for single-shot ultrafast electron diffraction (UED) are limited by the achievable electron probe bunch l...

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Bibliographic Details
Published in:Applied physics letters 2023-04, Vol.122 (14)
Main Authors: Othman, Mohamed A. K., Gabriel, Annika E., Snively, Emma C., Kozina, Michael E., Shen, Xiaozhe, Ji, Fuhao, Lewis, Samantha, Weathersby, Stephen, Vasireddy, Praful, Luo, Duan, Wang, Xijie, Hoffmann, Matthias C., Nanni, Emilio A.
Format: Article
Language:English
Subjects:
Applied physics
Electron beams
Electron diffraction
Electron probes
Organic crystals
PHYSICS OF ELEMENTARY PARTICLES AND FIELDS
Pulse propagation
Stamping
Temporal resolution
Time measurement
Timing jitter
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Summary:Visualizing ultrafast dynamics at the atomic scale requires time-resolved characterization with femtosecond temporal resolution. For fully relativistic electron bunch probes, existing techniques for single-shot ultrafast electron diffraction (UED) are limited by the achievable electron probe bunch length, charge, and timing jitter. We present the first experimental demonstration of dual-fed THz-driven compression and time-stamping that enables electron probes with improved temporal resolution. This technique utilizes two counter-propagating quasi-single-cycle THz pulses generated from two OH-1 organic crystals coupled into an optimized THz compressor structure. We demonstrate electron bunch compression and time-of-arrival jitter suppression by a factor of 3 paving the way toward unique opportunities for UED time-resolved measurements.
ISSN:0003-6951
1077-3118
DOI:10.1063/5.0134733