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Effects of substrate surface polarity on heteroepitaxial growth of pseudobinary ZnO–InN alloy films on ZnO substrates

(ZnO) X (InN) 1- X films have been epitaxially grown on 0.9%-lattice-mismatched ZnO substrates at 450 °C by sputtering. Films fabricated on O-polar substrates exhibit higher crystal quality and smoother surface. The full width at half-maximum of (0002) rocking curve and the root-mean-square roughnes...

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Bibliographic Details
Published in:Journal of materials research 2023-04, Vol.38 (7), p.1803-1812
Main Authors: Narishige, Ryota, Yamashita, Naoto, Kamataki, Kunihiro, Okumura, Takamasa, Koga, Kazunori, Shiratani, Masaharu, Yabuta, Hisato, Itagaki, Naho
Format: Article
Language:English
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Summary:(ZnO) X (InN) 1- X films have been epitaxially grown on 0.9%-lattice-mismatched ZnO substrates at 450 °C by sputtering. Films fabricated on O-polar substrates exhibit higher crystal quality and smoother surface. The full width at half-maximum of (0002) rocking curve and the root-mean-square roughness ( R q ) of a 30-nm-thick film on O-polar surface are 0.21° and 2.71 nm, respectively, whereas those on Zn-polar one are 0.32° and 4.30 nm, respectively. R q on O-polar surface further decreases to 0.73 nm as the thickness decreases to 10 nm, where we successfully obtained atomically flat single-crystalline films having atomically sharp interface with the substrates. High-resolution transmission electron microscopy revealed the Stranski–Krastanov (layer plus island) growth for O-polar case and just 3D islanding mode growth for Zn-polar one. All the results indicate the much longer migration length of adatoms on O-polar surface during the film growth, enabling adatoms to reach their thermodynamically favored positions even at low substrate temperature. Graphical abstract
ISSN:0884-2914
2044-5326
DOI:10.1557/s43578-022-00827-4