Jon Smart on Patterns and Antipatterns for Enterprise Software Success

Presents a panel discussion on the topic of Patterns and Antipatterns for Enterprise Software Success.

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Bibliographic Details
Published in:IEEE software 2023-05, Vol.40 (3), p.98-100
Main Authors: Ammanath, Brijesh, Blumen, Robert
Format: Article
Language:English
Subjects:
Enterprise resource planning
Pattern recognition
Software
Software development management
Online Access:Get full text
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Description
Summary:Presents a panel discussion on the topic of Patterns and Antipatterns for Enterprise Software Success.
ISSN:0740-7459
1937-4194
DOI:10.1109/MS.2023.3248899