Measurement of Low Polarization Losses of a Semiconductor Material in Finished Diodes

A method for the measurement of semiconductor polarization losses in the depletion region of a finished diode is considered. It is shown that the measurement can be performed by comparing with a low-loss capacitor using general-purpose impedance meters in laboratories without stabilizing the microcl...

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Bibliographic Details
Published in:Instruments and experimental techniques (New York) 2023-04, Vol.66 (2), p.324-329
Main Authors: Semyonov, E. V., Malakhovskiy, O. Yu
Format: Article
Language:English
Subjects:
Capacitors
Electrical Engineering
Electromagnetic fields
Electromagnetic shielding
Error analysis
Laboratory Techniques
Measurement Science and Instrumentation
Measuring instruments
Microclimate
Physical Chemistry
Physics
Physics and Astronomy
Polarization
Semiconductor materials
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Summary:A method for the measurement of semiconductor polarization losses in the depletion region of a finished diode is considered. It is shown that the measurement can be performed by comparing with a low-loss capacitor using general-purpose impedance meters in laboratories without stabilizing the microclimate and shielding the electromagnetic fields. To exclude the drift error under these conditions, multiple regular switching of the measurement object and low-loss capacitor is proposed. As a result, the polarization loss tangent of 1.9 × 10 −4 was measured with an error of ±16%.
ISSN:0020-4412
1608-3180
DOI:10.1134/S0020441223010207