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Stabilization of Diffraction Gratings Recorded in Poly-N-Epoxypropylcarbazole Films Doped with Iodoform

In poly- N -epoxypropylcarbazole films containing 10 wt % CHI 3 as an additive, diffraction gratings with a period of about 1 μm have been recorded by electron-beam irradiation at various radiation doses. The influence of the duration of storage in the dark of diffraction gratings on their diffracti...

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Bibliographic Details
Published in:High energy chemistry 2023-06, Vol.57 (3), p.264-268
Main Authors: Sergeev, S. A., Robu, S. V., Meshalkin, A. Yu, Iovu, M. S.
Format: Article
Language:English
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Summary:In poly- N -epoxypropylcarbazole films containing 10 wt % CHI 3 as an additive, diffraction gratings with a period of about 1 μm have been recorded by electron-beam irradiation at various radiation doses. The influence of the duration of storage in the dark of diffraction gratings on their diffraction efficiency has been examined. A postradiation increase in the diffraction efficiency of gratings recorded at relatively low electron radiation doses was observed. The diffraction efficiency values stabilized approximately on the sixth day after recording the diffraction gratings.
ISSN:0018-1439
1608-3148
DOI:10.1134/S0018143923030128