An Enhanced-Sensitivity Tangential Electric Field Probe with Tunable Resonant Frequency

A novel enhanced-sensitivity tangential E -field probe with tunable resonant frequency is proposed in this paper. This E -field probe consists of a front-end electric dipole induction part, tunable coupling resonators, a balun transmission section, and a coplanar waveguide transmission part. By intr...

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Bibliographic Details
Published in:IEEE transactions on instrumentation and measurement 2023-01, Vol.72, p.1-1
Main Authors: Chen, Zhi-Peng, Liu, Zhen-Guo, Zhang, Shang, Li, Meng-Zi, Lu, Wei-Bing
Format: Article
Language:English
Subjects:
Coplanar waveguides
Coupling
Couplings
Electric dipoles
electric field probe
Electric fields
enhanced sensitivity
Frequency measurement
frequency tunable
Microstrip transmission lines
Probes
resonant
Resonant frequencies
Resonant frequency
Resonators
Sensitivity
Sensitivity enhancement
Sensors
tangential
Varactor diodes
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Summary:A novel enhanced-sensitivity tangential E -field probe with tunable resonant frequency is proposed in this paper. This E -field probe consists of a front-end electric dipole induction part, tunable coupling resonators, a balun transmission section, and a coplanar waveguide transmission part. By introducing an improved electric dipole-induced element and resonant transmission, the detection sensitivity of the E -field probe can be significantly improved. Varactor diodes are loaded into the coupling resonators to achieve an adjustable resonant center frequency, thereby minimizing the contradiction between the high sensitivity and test bandwidth of the resonant E -field probe. A prototype of this tunable resonant frequency probe was fabricated and measured. When the reverse bias voltage applied to the varactors was tuned from 0 V to 20 V, the probe could obtain enhanced-sensitivity tangential E -field detection within the frequency band of 1.61-2.30 GHz. Moreover, this probe was also adopted to measure the E -field components in some areas of the microstrip line and antenna based on FR4. This probe can improve detection efficiency and reduce test costs on the premise of enhanced sensitivity detection. It has broad application prospects for near-field measurement in the future.
ISSN:0018-9456
1557-9662
DOI:10.1109/TIM.2023.3276025