Ultrafast nano-imaging of dark excitons

The role and impact of spatial heterogeneity in two-dimensional quantum materials represents one of the major research quests regarding the future application of these materials in optoelectronics and quantum information science. In the case of transition-metal dichalcogenide heterostructures, in pa...

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Bibliographic Details
Published in:arXiv.org 2023-05
Main Authors: Schmitt, David, Bange, Jan Philipp, Bennecke, Wiebke, Meneghini, Giuseppe, AlMutairi, AbdulAziz, Merboldt, Marco, Pöhls, Jonas, Watanabe, Kenji, Taniguchi, Takashi, Steil, Sabine, Steil, Daniel, Weitz, R Thomas, Hofmann, Stephan, Brem, Samuel, Jansen, G S Matthijs, Malic, Ermin, Mathias, Stefan, Reutzel, Marcel
Format: Article
Language:English
Subjects:
Excitons
Heterogeneity
Heterostructures
Microscopy
Momentum
Optoelectronics
Quantum phenomena
Spatial resolution
Transition metal compounds
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Summary:The role and impact of spatial heterogeneity in two-dimensional quantum materials represents one of the major research quests regarding the future application of these materials in optoelectronics and quantum information science. In the case of transition-metal dichalcogenide heterostructures, in particular, direct access to heterogeneities in the dark-exciton landscape with nanometer spatial and ultrafast time resolution is highly desired, but remains largely elusive. Here, we introduce ultrafast dark field momentum microscopy to spatio-temporally resolve dark exciton formation dynamics in a twisted WSe\(_2\)/MoS\(_2\) heterostructure with 55 femtosecond time- and 500~nm spatial resolution. This allows us to directly map spatial heterogeneity in the electronic and excitonic structure, and to correlate these with the dark exciton formation and relaxation dynamics. The benefits of simultaneous ultrafast nanoscale dark-field momentum microscopy and spectroscopy is groundbreaking for the present study, and opens the door to new types of experiments with unprecedented spectroscopic and spatiotemporal capabilities.
ISSN:2331-8422