Imbert–Fedorov shift of a Gaussian beam reflected from a dielectric/air interface and an air/epsilon-near-zero material interface

• Published in: Optical and quantum electronics 2023-09, Vol.55 (9), Article 776
• Main Authors: Zadjamal-Sayfi, Robab, Abdi-Ghaleh, Reza, Jamshidi-Ghaleh, Kazem
• Format: Article
• Language: English
• Subjects: Angle of reflection; Characterization and Evaluation of Materials; Computer Communication Networks; Electrical Engineering; Gaussian beams (optics); Incidence angle; Incident light; Lasers; Optical Devices; Optics; Permittivity; Photonics; Physics; Physics and Astronomy
• ISSN: 0306-8919; 1572-817X
• DOI: 10.1007/s11082-023-05059-2

In this work, the Imbert–Fedorov (IF) shift of an optical beam with a Gaussian profile reflected from a dielectric/air interface and an air/Epsilon-Near-Zero material interface is studied. The IF shift has been theoretically and numerically investigated for different incident angles and different dielectric constants at the incident wavelength of 633 nm. The results showed that by changing the polarization and angle of the incident light, as well as changing the dielectric constant of the matter, the behavior and amount of IF shift changes. Furthermore, for different dielectric constants, the peaks of the IF shift occur at different incidence angles. In addition, the amplitude and phase of the Fresnel reflection coefficients for both p and s polarizations, as well as the difference of the IF shift of the right- and left-handed circular components for incident p and s polarizations have been studied in terms of different incident angles. It is found that making a small variation in the values of each of the mentioned parameters changes the value of the IF shift.