Influence of La3+ substitution on the structural, magnetic and electrical characteristics of Sr2FeTiO6 double perovskites

In this study, the La 3+ ions are substituted at the Sr 2+ site in Sr 2 FeTiO 6 double perovskites using the solid state reaction method. The impact of La 3+ ion substitution on the Sr 2 FeTiO 6 physical characteristics have been studied. The SrTiO 3 structural parameters were utilised as starting m...

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Bibliographic Details
Published in:Journal of materials science. Materials in electronics 2023-07, Vol.34 (19), p.1462, Article 1462
Main Authors: Punitha, J. Stella, Nataraj, A., Anbarasu, V., Dhilip, M., Manikandan, M., Kumar, K. Saravana
Format: Article
Language:English
Subjects:
Characterization and Evaluation of Materials
Chemistry and Materials Science
Current carriers
Diffraction patterns
Ferromagnetism
Ions
Lanthanum
Materials Science
Optical and Electronic Materials
Parameters
Perovskites
Physical properties
Substitution reactions
Temperature dependence
X ray powder diffraction
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Summary:In this study, the La 3+ ions are substituted at the Sr 2+ site in Sr 2 FeTiO 6 double perovskites using the solid state reaction method. The impact of La 3+ ion substitution on the Sr 2 FeTiO 6 physical characteristics have been studied. The SrTiO 3 structural parameters were utilised as starting model for performing the Rietveld refinement of powder X-ray diffraction patterns. Cubic symmetry with Pm3m space group was determined for the prepared materials. Due to the larger ionic radii of La 3+ ion, the La substituted samples showed slight increase in the lattice cell parameters leading to volume expansion. The La-substituted samples don’t exhibit any significant morphological differences when compared to parent compound. The diffused reflectance measurements also show no significant changes in the band gap values of La-substituted samples in comparison with the pure compound. The magnetization studies exhibit the enhanced ferromagnetic nature of La-substituted sample. Thermally activated charge carriers are also evident from the analysis of temperature dependent dielectric measurements.
ISSN:0957-4522
1573-482X
DOI:10.1007/s10854-023-10793-0