Loading…
Role of Main Group Nonmetal Dopants on the Electronic Properties of the TcS2 Monolayer Revealed by Density Functional Theory
The electronic properties of n - and p -type semiconductors using nonmetals (H, B, C, N, O, Si, P, Se, F, Cl, Br, and I) to substitute sulfur in the TcS 2 monolayer were investigated using first-principles methods based on the density functional theory. The H-, B-, C-, N-, Si-, and P-doped systems w...
Saved in:
Published in: | Journal of electronic materials 2023-09, Vol.52 (9), p.5931-5945 |
---|---|
Main Authors: | , , , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites |
Online Access: | Get full text |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Summary: | The electronic properties of
n
- and
p
-type semiconductors using nonmetals (H, B, C, N, O, Si, P, Se, F, Cl, Br, and I) to substitute sulfur in the TcS
2
monolayer were investigated using first-principles methods based on the density functional theory. The H-, B-, C-, N-, Si-, and P-doped systems were
p
-type, whereas the F-doped systems were
n
-type semiconductors. Numerical results showed that these nonmetals induced magnetic properties through the dopant
p
orbital and neighboring Tc atom
d
orbitals. H-, B-, N-, P-, and F-doped systems exhibited semiconducting magnetic nanomaterial features, whereas Cl-, Br-, and I-doped systems exhibited half-metallic magnetic features. The formation energy of the C-doped system was the lowest followed by the O-doped system, compared to that of the other examined systems. Under Tc-rich growth conditions, the preparation of nonmetal-doped TcS
2
was facile and stable because of its negative impurity formation energy. A more significant change was observed at the band edges of the doped systems compared to the pristine TcS
2
monolayer. These results provided fundamental insights into the doped TcS
2
monolayer for application as photocatalysts and spintronic, optoelectronic, and electronic devices. |
---|---|
ISSN: | 0361-5235 1543-186X |
DOI: | 10.1007/s11664-023-10513-8 |