Capability process on shewhart p control chart and ISRT p EWMA control chart on shift drum production

• Main Authors: Wahyukaton, Herman, Ramdani
• Format: Conference Proceeding
• Language: English
• Subjects: Control charts; Control data (computers); Mathematical analysis; Parameter sensitivity; Process controls; Process parameters; Quality control
• ISSN: 0094-243X; 1551-7616
• DOI: 10.1063/5.0104946

The common often used control chart on the quality control process is Shewhart Control Chart. However, the Shewhart Control Chart seems to be less sensitive in small shifting on process control. The ISRT p EWMA Control Chart is proposed to detecting a small shifting, which can be used on the condition for the value of np > 5. The data have been processed and calculated using the Shewhart p control chart and the ISRT p EWMA Control Chart using defects on shift drums. When the process has been controlled, then start to calculate the capability process for each control chart. There are two parameters on the ISRT p EWMA Control Chart, which are λ and L, and the weighted value was given will significantly affect shift detection. From the calculation, it was known that the ISRT p EWMA Control Chart was better at detecting out-of-control data. The smaller parameter value is given, then the ISRT p EWMA Control Chart was more sensitive on shifting detection, and the smaller parameter value, then the capability process will decrease. The parameter value of λ is 0.20 and L = 2.962 is the lowest value to find the capability process larger than 1.00.