Loading…

Effect of laser energy on the morphology and electrical properties of Fe3O4 thin films deposited by PLD

The prepared nanostructured Fe3O4 thin films might be applicable in different fields such as gas sensing application. Iron oxide (Fe3O4) thin films were prepared on quartz and p-Si at 200 °C substrate temperature by pulsed laser deposition (PLD) with laser energy of (800 and 1000) mJ. These thin fil...

Full description

Saved in:
Bibliographic Details
Main Authors: Abdulkareem, Khalid A., Kadhim, Suad M., Ali, Shams B.
Format: Conference Proceeding
Language:English
Subjects:
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
cited_by
cites
container_end_page
container_issue 1
container_start_page
container_title
container_volume 2806
creator Abdulkareem, Khalid A.
Kadhim, Suad M.
Ali, Shams B.
description The prepared nanostructured Fe3O4 thin films might be applicable in different fields such as gas sensing application. Iron oxide (Fe3O4) thin films were prepared on quartz and p-Si at 200 °C substrate temperature by pulsed laser deposition (PLD) with laser energy of (800 and 1000) mJ. These thin films were examined by different techniques. The X-ray diffraction showed a polycrystalline structure of cubic Fe3O4 phase. The crystallinity was enhanced the crystalline size increased when increasing the laser energy from 800 mJ to 1000 mJ. Field emission scanning electron microscopy was shown that the sample with the 800 mJ has a flat surface consisting of compact particles (276) nm, covered with cubes structures of dimensions ranging from 111 to 422 nm. The cubes disappeared, and the branching structures appeared, merging with the surface. The Hall effect indicates that increasing laser energy the carrier concentration increases, while the conductivity and Hall motion decrease. Atomic force microscopy (AFM) indicated that when the laser power increased the particle size increased, and the surface roughness decreased. The capacitance -voltage pointed that the Vbi was decreased from 0.55 to 0.45 V with increasing laser energy.
doi_str_mv 10.1063/5.0164996
format conference_proceeding
fullrecord <record><control><sourceid>proquest_scita</sourceid><recordid>TN_cdi_proquest_journals_2859723275</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>2859723275</sourcerecordid><originalsourceid>FETCH-LOGICAL-p133t-f2963736cf686f46a68bdfda4b9b59e8c423d9d094c14f2df4c065ab1075eccc3</originalsourceid><addsrcrecordid>eNotkEtLAzEUhYMoWKsL_0HAnTA175kspbYqFOpCwV3I5NGmTCdjki76753Sri4cvnPPvQeAR4xmGAn6wmcICyaluAITzDmuaoHFNZggJFlFGP29BXc57xAisq6bCdgsvHemwOhhp7NL0PUubY4w9rBsHdzHNGxjF0dF9xa6bmRTMLqDQ4qDSyW4fPIuHV2z0RF66EO3z9C6IeZQnIXtEX6t3u7Bjddddg-XOQU_y8X3_KNard8_56-rasCUlsoTKWhNhfGiEZ4JLZrWeqtZK1suXWMYoVba8RmDmSfWM4ME1y1GNXfGGDoFT-e9431_B5eL2sVD6sdIRRoua0JJzUfq-UxlE4ouIfZqSGGv01FhpE5FKq4uRdJ_A_xlXg</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>conference_proceeding</recordtype><pqid>2859723275</pqid></control><display><type>conference_proceeding</type><title>Effect of laser energy on the morphology and electrical properties of Fe3O4 thin films deposited by PLD</title><source>American Institute of Physics:Jisc Collections:Transitional Journals Agreement 2021-23 (Reading list)</source><creator>Abdulkareem, Khalid A. ; Kadhim, Suad M. ; Ali, Shams B.</creator><contributor>Al-Mansoori, Tariq ; Al-Rifaie, Ali ; Shanbara, Haider Kamil ; Hameed, Othman ; Al-Jaberi, Furat Yasir ; Al-Hussainy, Alaa ; Dakhil, Riyadh</contributor><creatorcontrib>Abdulkareem, Khalid A. ; Kadhim, Suad M. ; Ali, Shams B. ; Al-Mansoori, Tariq ; Al-Rifaie, Ali ; Shanbara, Haider Kamil ; Hameed, Othman ; Al-Jaberi, Furat Yasir ; Al-Hussainy, Alaa ; Dakhil, Riyadh</creatorcontrib><description>The prepared nanostructured Fe3O4 thin films might be applicable in different fields such as gas sensing application. Iron oxide (Fe3O4) thin films were prepared on quartz and p-Si at 200 °C substrate temperature by pulsed laser deposition (PLD) with laser energy of (800 and 1000) mJ. These thin films were examined by different techniques. The X-ray diffraction showed a polycrystalline structure of cubic Fe3O4 phase. The crystallinity was enhanced the crystalline size increased when increasing the laser energy from 800 mJ to 1000 mJ. Field emission scanning electron microscopy was shown that the sample with the 800 mJ has a flat surface consisting of compact particles (276) nm, covered with cubes structures of dimensions ranging from 111 to 422 nm. The cubes disappeared, and the branching structures appeared, merging with the surface. The Hall effect indicates that increasing laser energy the carrier concentration increases, while the conductivity and Hall motion decrease. Atomic force microscopy (AFM) indicated that when the laser power increased the particle size increased, and the surface roughness decreased. The capacitance -voltage pointed that the Vbi was decreased from 0.55 to 0.45 V with increasing laser energy.</description><identifier>ISSN: 0094-243X</identifier><identifier>EISSN: 1551-7616</identifier><identifier>DOI: 10.1063/5.0164996</identifier><identifier>CODEN: APCPCS</identifier><language>eng</language><publisher>Melville: American Institute of Physics</publisher><subject>Carrier density ; Cubes ; Electrical properties ; Field emission microscopy ; Flat surfaces ; Gas sensors ; Hall effect ; Iron oxides ; Lasers ; Microscopy ; Pulsed laser deposition ; Pulsed lasers ; Silicon substrates ; Surface roughness ; Thin films</subject><ispartof>AIP conference proceedings, 2023, Vol.2806 (1)</ispartof><rights>Author(s)</rights><rights>2023 Author(s). Published by AIP Publishing.</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail></links><search><contributor>Al-Mansoori, Tariq</contributor><contributor>Al-Rifaie, Ali</contributor><contributor>Shanbara, Haider Kamil</contributor><contributor>Hameed, Othman</contributor><contributor>Al-Jaberi, Furat Yasir</contributor><contributor>Al-Hussainy, Alaa</contributor><contributor>Dakhil, Riyadh</contributor><creatorcontrib>Abdulkareem, Khalid A.</creatorcontrib><creatorcontrib>Kadhim, Suad M.</creatorcontrib><creatorcontrib>Ali, Shams B.</creatorcontrib><title>Effect of laser energy on the morphology and electrical properties of Fe3O4 thin films deposited by PLD</title><title>AIP conference proceedings</title><description>The prepared nanostructured Fe3O4 thin films might be applicable in different fields such as gas sensing application. Iron oxide (Fe3O4) thin films were prepared on quartz and p-Si at 200 °C substrate temperature by pulsed laser deposition (PLD) with laser energy of (800 and 1000) mJ. These thin films were examined by different techniques. The X-ray diffraction showed a polycrystalline structure of cubic Fe3O4 phase. The crystallinity was enhanced the crystalline size increased when increasing the laser energy from 800 mJ to 1000 mJ. Field emission scanning electron microscopy was shown that the sample with the 800 mJ has a flat surface consisting of compact particles (276) nm, covered with cubes structures of dimensions ranging from 111 to 422 nm. The cubes disappeared, and the branching structures appeared, merging with the surface. The Hall effect indicates that increasing laser energy the carrier concentration increases, while the conductivity and Hall motion decrease. Atomic force microscopy (AFM) indicated that when the laser power increased the particle size increased, and the surface roughness decreased. The capacitance -voltage pointed that the Vbi was decreased from 0.55 to 0.45 V with increasing laser energy.</description><subject>Carrier density</subject><subject>Cubes</subject><subject>Electrical properties</subject><subject>Field emission microscopy</subject><subject>Flat surfaces</subject><subject>Gas sensors</subject><subject>Hall effect</subject><subject>Iron oxides</subject><subject>Lasers</subject><subject>Microscopy</subject><subject>Pulsed laser deposition</subject><subject>Pulsed lasers</subject><subject>Silicon substrates</subject><subject>Surface roughness</subject><subject>Thin films</subject><issn>0094-243X</issn><issn>1551-7616</issn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2023</creationdate><recordtype>conference_proceeding</recordtype><recordid>eNotkEtLAzEUhYMoWKsL_0HAnTA175kspbYqFOpCwV3I5NGmTCdjki76753Sri4cvnPPvQeAR4xmGAn6wmcICyaluAITzDmuaoHFNZggJFlFGP29BXc57xAisq6bCdgsvHemwOhhp7NL0PUubY4w9rBsHdzHNGxjF0dF9xa6bmRTMLqDQ4qDSyW4fPIuHV2z0RF66EO3z9C6IeZQnIXtEX6t3u7Bjddddg-XOQU_y8X3_KNard8_56-rasCUlsoTKWhNhfGiEZ4JLZrWeqtZK1suXWMYoVba8RmDmSfWM4ME1y1GNXfGGDoFT-e9431_B5eL2sVD6sdIRRoua0JJzUfq-UxlE4ouIfZqSGGv01FhpE5FKq4uRdJ_A_xlXg</recordid><startdate>20230901</startdate><enddate>20230901</enddate><creator>Abdulkareem, Khalid A.</creator><creator>Kadhim, Suad M.</creator><creator>Ali, Shams B.</creator><general>American Institute of Physics</general><scope>8FD</scope><scope>H8D</scope><scope>L7M</scope></search><sort><creationdate>20230901</creationdate><title>Effect of laser energy on the morphology and electrical properties of Fe3O4 thin films deposited by PLD</title><author>Abdulkareem, Khalid A. ; Kadhim, Suad M. ; Ali, Shams B.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-p133t-f2963736cf686f46a68bdfda4b9b59e8c423d9d094c14f2df4c065ab1075eccc3</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2023</creationdate><topic>Carrier density</topic><topic>Cubes</topic><topic>Electrical properties</topic><topic>Field emission microscopy</topic><topic>Flat surfaces</topic><topic>Gas sensors</topic><topic>Hall effect</topic><topic>Iron oxides</topic><topic>Lasers</topic><topic>Microscopy</topic><topic>Pulsed laser deposition</topic><topic>Pulsed lasers</topic><topic>Silicon substrates</topic><topic>Surface roughness</topic><topic>Thin films</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Abdulkareem, Khalid A.</creatorcontrib><creatorcontrib>Kadhim, Suad M.</creatorcontrib><creatorcontrib>Ali, Shams B.</creatorcontrib><collection>Technology Research Database</collection><collection>Aerospace Database</collection><collection>Advanced Technologies Database with Aerospace</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Abdulkareem, Khalid A.</au><au>Kadhim, Suad M.</au><au>Ali, Shams B.</au><addau>Al-Mansoori, Tariq</addau><addau>Al-Rifaie, Ali</addau><addau>Shanbara, Haider Kamil</addau><addau>Hameed, Othman</addau><addau>Al-Jaberi, Furat Yasir</addau><addau>Al-Hussainy, Alaa</addau><addau>Dakhil, Riyadh</addau><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Effect of laser energy on the morphology and electrical properties of Fe3O4 thin films deposited by PLD</atitle><btitle>AIP conference proceedings</btitle><date>2023-09-01</date><risdate>2023</risdate><volume>2806</volume><issue>1</issue><issn>0094-243X</issn><eissn>1551-7616</eissn><coden>APCPCS</coden><abstract>The prepared nanostructured Fe3O4 thin films might be applicable in different fields such as gas sensing application. Iron oxide (Fe3O4) thin films were prepared on quartz and p-Si at 200 °C substrate temperature by pulsed laser deposition (PLD) with laser energy of (800 and 1000) mJ. These thin films were examined by different techniques. The X-ray diffraction showed a polycrystalline structure of cubic Fe3O4 phase. The crystallinity was enhanced the crystalline size increased when increasing the laser energy from 800 mJ to 1000 mJ. Field emission scanning electron microscopy was shown that the sample with the 800 mJ has a flat surface consisting of compact particles (276) nm, covered with cubes structures of dimensions ranging from 111 to 422 nm. The cubes disappeared, and the branching structures appeared, merging with the surface. The Hall effect indicates that increasing laser energy the carrier concentration increases, while the conductivity and Hall motion decrease. Atomic force microscopy (AFM) indicated that when the laser power increased the particle size increased, and the surface roughness decreased. The capacitance -voltage pointed that the Vbi was decreased from 0.55 to 0.45 V with increasing laser energy.</abstract><cop>Melville</cop><pub>American Institute of Physics</pub><doi>10.1063/5.0164996</doi><tpages>8</tpages></addata></record>
fulltext fulltext
identifier ISSN: 0094-243X
ispartof AIP conference proceedings, 2023, Vol.2806 (1)
issn 0094-243X
1551-7616
language eng
recordid cdi_proquest_journals_2859723275
source American Institute of Physics:Jisc Collections:Transitional Journals Agreement 2021-23 (Reading list)
subjects Carrier density
Cubes
Electrical properties
Field emission microscopy
Flat surfaces
Gas sensors
Hall effect
Iron oxides
Lasers
Microscopy
Pulsed laser deposition
Pulsed lasers
Silicon substrates
Surface roughness
Thin films
title Effect of laser energy on the morphology and electrical properties of Fe3O4 thin films deposited by PLD
url http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-03-09T01%3A43%3A21IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_scita&rft_val_fmt=info:ofi/fmt:kev:mtx:book&rft.genre=proceeding&rft.atitle=Effect%20of%20laser%20energy%20on%20the%20morphology%20and%20electrical%20properties%20of%20Fe3O4%20thin%20films%20deposited%20by%20PLD&rft.btitle=AIP%20conference%20proceedings&rft.au=Abdulkareem,%20Khalid%20A.&rft.date=2023-09-01&rft.volume=2806&rft.issue=1&rft.issn=0094-243X&rft.eissn=1551-7616&rft.coden=APCPCS&rft_id=info:doi/10.1063/5.0164996&rft_dat=%3Cproquest_scita%3E2859723275%3C/proquest_scita%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-p133t-f2963736cf686f46a68bdfda4b9b59e8c423d9d094c14f2df4c065ab1075eccc3%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_pqid=2859723275&rft_id=info:pmid/&rfr_iscdi=true