Diffraction of X-rays in Crystals: A Tensor Approach

The use of X-ray synchrotron radiation makes it possible to observe the polarization, spectral, and angular dependences for diffraction reflections. Their theoretical study calls for application of a tensor approach to describe the interaction of X-rays with atoms of matter. Various representations...

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Bibliographic Details
Published in:Crystallography reports 2023-06, Vol.68 (3), p.351-362
Main Authors: Oreshko, A. P., Ovchinnikova, E. N., Dmitrienko, V. E.
Format: Article
Language:English
Subjects:
Anisotropy
Crystallography and Scattering Methods
Magnetic properties
Mathematical analysis
Multipoles
Physics
Physics and Astronomy
Reviews
Scattering amplitude
Synchrotron radiation
Synchrotrons
Tensors
X-ray scattering
X-rays
Citations: Items that this one cites
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Summary:The use of X-ray synchrotron radiation makes it possible to observe the polarization, spectral, and angular dependences for diffraction reflections. Their theoretical study calls for application of a tensor approach to describe the interaction of X-rays with atoms of matter. Various representations of the tensor atomic scattering amplitude, results of experimental observations of the anisotropy of resonant X-ray scattering, and the relationship of the electric and magnetic multipole moments on atoms with the properties of forbidden resonant reflections are considered.
ISSN:1063-7745
1562-689X
DOI:10.1134/S1063774523700013