Loading…

A Coupled Inductor-Based High-Gain ZVS DC-DC Converter With Reduced Voltage Stresses

In this article, a new coupled inductor-based high voltage gain dc-dc converter with continuous input current and reduced semiconductor stresses (with respect to the competitive topologies) is presented. The coupled inductor windings are used in the voltage multiplier cells to increase the boost fac...

Full description

Saved in:
Bibliographic Details
Published in:IEEE transactions on power electronics 2023-12, Vol.38 (12), p.15956-15967
Main Authors: Rao, Burle Tulasi, De, Dipankar
Format: Article
Language:English
Subjects:
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:In this article, a new coupled inductor-based high voltage gain dc-dc converter with continuous input current and reduced semiconductor stresses (with respect to the competitive topologies) is presented. The coupled inductor windings are used in the voltage multiplier cells to increase the boost factor of the converter. The proposed topology achieves a high efficiency due to: 1) soft switching of the main and auxiliary switches along with the power diodes; 2) active clamp circuit based coupled inductor leakage energy recycling to the output; 3) improved output-side power diodes reverse recovery performance because of a reduced falling current rate due to the presence of leakage inductance; 4) lower on -state resistance and lower conduction losses in the semiconductor switches because of the reduced voltage rating of the switches. The performance of the converter is evaluated analytically to demonstrate efficiency improvement, reduced semiconductor stress, and high voltage gain capabilities. Furthermore, a detailed comparative study is presented. The proposed topology is found to be superior compared to recent state of art configurations. Through simulation studies and experimentation on a 250 W prototype, the proposed concept is validated.
ISSN:0885-8993
1941-0107
DOI:10.1109/TPEL.2023.3310577