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Structural Study, Observation of Non-Ohmic I–V Characteristics and Analysis of Meyer–Neldel Rule in Sb-Additive Se-Te-Ge Quaternary Amorphous Alloys
In the present study, bulk samples of chalcogenide (Se 80 Te 20 ) 94- x Ge 6 Sb x ( x = 1, 2, 4, 6, 8 and 10) alloys were prepared using the melt-quenching technique. The amorphous nature of the as-primed samples was confirmed via x-ray diffraction. Current–voltage ( I – V ) measurements were carri...
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Published in: | Journal of electronic materials 2023-12, Vol.52 (12), p.8182-8190 |
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creator | Patial, Balbir Singh Rani, Rozy Kumari, Anita Thakur, Nagesh |
description | In the present study, bulk samples of chalcogenide (Se
80
Te
20
)
94-
x
Ge
6
Sb
x
(
x
= 1, 2, 4, 6, 8 and 10) alloys were prepared using the melt-quenching technique. The amorphous nature of the as-primed samples was confirmed via x-ray diffraction. Current–voltage (
I
–
V
) measurements were carried out at room temperature as well as at elevated temperatures up to 373 K.
I
–
V
characteristics point toward ohmic behaviour at a low electric field, whereas non-ohmic behaviour is observed at a higher electric field. The chalcogenide glass with
x
= 8 shows maximum conductivity in the composition range under investigation. The temperature dependence of conductivity is also determined. The variation of ln(
σ
DC
) against the reciprocal of temperature exhibits Arrhenius behaviour. From the slope and intercept, Δ
Ε
and
σ
o
were calculated. The Meyer–Neldel (MN) rule between pre-exponential factor and activation energy is also observed. Conduction mechanism is concluded to be in the band tails of localized states responsible for electrical conduction in as-prepared glasses. |
doi_str_mv | 10.1007/s11664-023-10737-8 |
format | article |
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80
Te
20
)
94-
x
Ge
6
Sb
x
(
x
= 1, 2, 4, 6, 8 and 10) alloys were prepared using the melt-quenching technique. The amorphous nature of the as-primed samples was confirmed via x-ray diffraction. Current–voltage (
I
–
V
) measurements were carried out at room temperature as well as at elevated temperatures up to 373 K.
I
–
V
characteristics point toward ohmic behaviour at a low electric field, whereas non-ohmic behaviour is observed at a higher electric field. The chalcogenide glass with
x
= 8 shows maximum conductivity in the composition range under investigation. The temperature dependence of conductivity is also determined. The variation of ln(
σ
DC
) against the reciprocal of temperature exhibits Arrhenius behaviour. From the slope and intercept, Δ
Ε
and
σ
o
were calculated. The Meyer–Neldel (MN) rule between pre-exponential factor and activation energy is also observed. Conduction mechanism is concluded to be in the band tails of localized states responsible for electrical conduction in as-prepared glasses.</description><identifier>ISSN: 0361-5235</identifier><identifier>EISSN: 1543-186X</identifier><identifier>DOI: 10.1007/s11664-023-10737-8</identifier><language>eng</language><publisher>New York: Springer US</publisher><subject>Amorphous alloys ; Chalcogenides ; Characterization and Evaluation of Materials ; Chemistry and Materials Science ; Current voltage characteristics ; Electric fields ; Electrical conduction ; Electronics and Microelectronics ; High temperature ; Instrumentation ; Materials Science ; Metallic glasses ; Optical and Electronic Materials ; Original Research Article ; Room temperature ; Solid State Physics ; Temperature ; Temperature dependence</subject><ispartof>Journal of electronic materials, 2023-12, Vol.52 (12), p.8182-8190</ispartof><rights>The Minerals, Metals & Materials Society 2023. Springer Nature or its licensor (e.g. a society or other partner) holds exclusive rights to this article under a publishing agreement with the author(s) or other rightsholder(s); author self-archiving of the accepted manuscript version of this article is solely governed by the terms of such publishing agreement and applicable law.</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><cites>FETCH-LOGICAL-c270t-5ce82f4e4084b1981b6cb75f2eea0e0e5dea2bd296f6884e372716f4bc1f4ee03</cites><orcidid>0000-0002-6541-4787</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,780,784,27924,27925</link.rule.ids></links><search><creatorcontrib>Patial, Balbir Singh</creatorcontrib><creatorcontrib>Rani, Rozy</creatorcontrib><creatorcontrib>Kumari, Anita</creatorcontrib><creatorcontrib>Thakur, Nagesh</creatorcontrib><title>Structural Study, Observation of Non-Ohmic I–V Characteristics and Analysis of Meyer–Neldel Rule in Sb-Additive Se-Te-Ge Quaternary Amorphous Alloys</title><title>Journal of electronic materials</title><addtitle>J. Electron. Mater</addtitle><description>In the present study, bulk samples of chalcogenide (Se
80
Te
20
)
94-
x
Ge
6
Sb
x
(
x
= 1, 2, 4, 6, 8 and 10) alloys were prepared using the melt-quenching technique. The amorphous nature of the as-primed samples was confirmed via x-ray diffraction. Current–voltage (
I
–
V
) measurements were carried out at room temperature as well as at elevated temperatures up to 373 K.
I
–
V
characteristics point toward ohmic behaviour at a low electric field, whereas non-ohmic behaviour is observed at a higher electric field. The chalcogenide glass with
x
= 8 shows maximum conductivity in the composition range under investigation. The temperature dependence of conductivity is also determined. The variation of ln(
σ
DC
) against the reciprocal of temperature exhibits Arrhenius behaviour. From the slope and intercept, Δ
Ε
and
σ
o
were calculated. The Meyer–Neldel (MN) rule between pre-exponential factor and activation energy is also observed. Conduction mechanism is concluded to be in the band tails of localized states responsible for electrical conduction in as-prepared glasses.</description><subject>Amorphous alloys</subject><subject>Chalcogenides</subject><subject>Characterization and Evaluation of Materials</subject><subject>Chemistry and Materials Science</subject><subject>Current voltage characteristics</subject><subject>Electric fields</subject><subject>Electrical conduction</subject><subject>Electronics and Microelectronics</subject><subject>High temperature</subject><subject>Instrumentation</subject><subject>Materials Science</subject><subject>Metallic glasses</subject><subject>Optical and Electronic Materials</subject><subject>Original Research Article</subject><subject>Room temperature</subject><subject>Solid State Physics</subject><subject>Temperature</subject><subject>Temperature dependence</subject><issn>0361-5235</issn><issn>1543-186X</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2023</creationdate><recordtype>article</recordtype><recordid>eNp9kc1OGzEURq2KSg1pX6ArS2xxsT1_znIUAY0ERCVp1Z3l8dxpjJxxsD2RZsc7sOH5eBIMQWLX1dWVzvl0dT-EvjP6g1FanQXGyjInlGeE0SqriPiEJqzI0yrKv0doQrOSkYJnxRd0HMIdpaxggk3Q0yr6QcfBK4tXcWjHU7xsAvi9isb12HX4xvVkudkajRfPD49_8HyjvNIRvAnR6IBV3-K6V3YMJrzy1zCCT-QN2BYsvh0sYNPjVUPqtjXR7AGvgKyBXAL-NagU1Cs_4nrr_G7jhoBra90YvqLPnbIBvr3PKfp9cb6e_yRXy8vFvL4imlc0kkKD4F0OORV5w2aCNaVuqqLjAIoChaIFxZuWz8quFCKHrOIVK7u80SxZQLMpOjnk7ry7HyBEeeeGdJINkidhlvH0z0TxA6W9C8FDJ3febNPdklH52oA8NCBTA_KtASmSlB2kkOD-H_iP6P9YLxRKjNM</recordid><startdate>20231201</startdate><enddate>20231201</enddate><creator>Patial, Balbir Singh</creator><creator>Rani, Rozy</creator><creator>Kumari, Anita</creator><creator>Thakur, Nagesh</creator><general>Springer US</general><general>Springer Nature B.V</general><scope>AAYXX</scope><scope>CITATION</scope><scope>3V.</scope><scope>7XB</scope><scope>88I</scope><scope>8AF</scope><scope>8AO</scope><scope>8FE</scope><scope>8FG</scope><scope>8FK</scope><scope>8G5</scope><scope>ABJCF</scope><scope>ABUWG</scope><scope>AFKRA</scope><scope>ARAPS</scope><scope>AZQEC</scope><scope>BENPR</scope><scope>BGLVJ</scope><scope>CCPQU</scope><scope>D1I</scope><scope>DWQXO</scope><scope>GNUQQ</scope><scope>GUQSH</scope><scope>HCIFZ</scope><scope>KB.</scope><scope>L6V</scope><scope>M2O</scope><scope>M2P</scope><scope>M7S</scope><scope>MBDVC</scope><scope>P5Z</scope><scope>P62</scope><scope>PDBOC</scope><scope>PQEST</scope><scope>PQQKQ</scope><scope>PQUKI</scope><scope>PTHSS</scope><scope>Q9U</scope><scope>S0X</scope><orcidid>https://orcid.org/0000-0002-6541-4787</orcidid></search><sort><creationdate>20231201</creationdate><title>Structural Study, Observation of Non-Ohmic I–V Characteristics and Analysis of Meyer–Neldel Rule in Sb-Additive Se-Te-Ge Quaternary Amorphous Alloys</title><author>Patial, Balbir Singh ; Rani, Rozy ; Kumari, Anita ; Thakur, Nagesh</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c270t-5ce82f4e4084b1981b6cb75f2eea0e0e5dea2bd296f6884e372716f4bc1f4ee03</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2023</creationdate><topic>Amorphous alloys</topic><topic>Chalcogenides</topic><topic>Characterization and Evaluation of Materials</topic><topic>Chemistry and Materials Science</topic><topic>Current voltage characteristics</topic><topic>Electric fields</topic><topic>Electrical conduction</topic><topic>Electronics and Microelectronics</topic><topic>High temperature</topic><topic>Instrumentation</topic><topic>Materials Science</topic><topic>Metallic glasses</topic><topic>Optical and Electronic Materials</topic><topic>Original Research Article</topic><topic>Room temperature</topic><topic>Solid State Physics</topic><topic>Temperature</topic><topic>Temperature dependence</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Patial, Balbir Singh</creatorcontrib><creatorcontrib>Rani, Rozy</creatorcontrib><creatorcontrib>Kumari, Anita</creatorcontrib><creatorcontrib>Thakur, Nagesh</creatorcontrib><collection>CrossRef</collection><collection>ProQuest Central (Corporate)</collection><collection>ProQuest Central (purchase pre-March 2016)</collection><collection>Science Database (Alumni Edition)</collection><collection>STEM Database</collection><collection>ProQuest Pharma Collection</collection><collection>ProQuest SciTech Collection</collection><collection>ProQuest Technology Collection</collection><collection>ProQuest Central (Alumni) (purchase pre-March 2016)</collection><collection>Research Library (Alumni Edition)</collection><collection>Materials Science & Engineering Collection</collection><collection>ProQuest Central (Alumni)</collection><collection>ProQuest Central</collection><collection>Advanced Technologies & Aerospace Collection</collection><collection>ProQuest Central Essentials</collection><collection>AUTh Library subscriptions: ProQuest Central</collection><collection>Technology Collection</collection><collection>ProQuest One Community College</collection><collection>ProQuest Materials Science Collection</collection><collection>ProQuest Central Korea</collection><collection>ProQuest Central Student</collection><collection>Research Library Prep</collection><collection>SciTech Premium Collection</collection><collection>https://resources.nclive.org/materials</collection><collection>ProQuest Engineering Collection</collection><collection>ProQuest research library</collection><collection>Science Database (ProQuest)</collection><collection>ProQuest Engineering Database</collection><collection>Research Library (Corporate)</collection><collection>ProQuest advanced technologies & aerospace journals</collection><collection>ProQuest Advanced Technologies & Aerospace Collection</collection><collection>Materials science collection</collection><collection>ProQuest One Academic Eastern Edition (DO NOT USE)</collection><collection>ProQuest One Academic</collection><collection>ProQuest One Academic UKI Edition</collection><collection>Engineering collection</collection><collection>ProQuest Central Basic</collection><collection>SIRS Editorial</collection><jtitle>Journal of electronic materials</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Patial, Balbir Singh</au><au>Rani, Rozy</au><au>Kumari, Anita</au><au>Thakur, Nagesh</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Structural Study, Observation of Non-Ohmic I–V Characteristics and Analysis of Meyer–Neldel Rule in Sb-Additive Se-Te-Ge Quaternary Amorphous Alloys</atitle><jtitle>Journal of electronic materials</jtitle><stitle>J. Electron. Mater</stitle><date>2023-12-01</date><risdate>2023</risdate><volume>52</volume><issue>12</issue><spage>8182</spage><epage>8190</epage><pages>8182-8190</pages><issn>0361-5235</issn><eissn>1543-186X</eissn><abstract>In the present study, bulk samples of chalcogenide (Se
80
Te
20
)
94-
x
Ge
6
Sb
x
(
x
= 1, 2, 4, 6, 8 and 10) alloys were prepared using the melt-quenching technique. The amorphous nature of the as-primed samples was confirmed via x-ray diffraction. Current–voltage (
I
–
V
) measurements were carried out at room temperature as well as at elevated temperatures up to 373 K.
I
–
V
characteristics point toward ohmic behaviour at a low electric field, whereas non-ohmic behaviour is observed at a higher electric field. The chalcogenide glass with
x
= 8 shows maximum conductivity in the composition range under investigation. The temperature dependence of conductivity is also determined. The variation of ln(
σ
DC
) against the reciprocal of temperature exhibits Arrhenius behaviour. From the slope and intercept, Δ
Ε
and
σ
o
were calculated. The Meyer–Neldel (MN) rule between pre-exponential factor and activation energy is also observed. Conduction mechanism is concluded to be in the band tails of localized states responsible for electrical conduction in as-prepared glasses.</abstract><cop>New York</cop><pub>Springer US</pub><doi>10.1007/s11664-023-10737-8</doi><tpages>9</tpages><orcidid>https://orcid.org/0000-0002-6541-4787</orcidid></addata></record> |
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source | Springer Nature |
subjects | Amorphous alloys Chalcogenides Characterization and Evaluation of Materials Chemistry and Materials Science Current voltage characteristics Electric fields Electrical conduction Electronics and Microelectronics High temperature Instrumentation Materials Science Metallic glasses Optical and Electronic Materials Original Research Article Room temperature Solid State Physics Temperature Temperature dependence |
title | Structural Study, Observation of Non-Ohmic I–V Characteristics and Analysis of Meyer–Neldel Rule in Sb-Additive Se-Te-Ge Quaternary Amorphous Alloys |
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