Analysis of x-ray diffraction lines of cuprous oxide nanoparticles by using variance analysis method

In this study, the results of x-ray diffraction methods were used to determine the Crystallite size and Lattice strain of Cu2O nanoparticles then to compare the results obtained by using variance analysis method, Scherrer method and Williamson-Hall method. The results of these methods of the same po...

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Bibliographic Details
Main Authors: Alsoltani, Karrar A., Harbbi, Khalid H.
Format: Conference Proceeding
Language:English
Subjects:
Copper oxides
Crystallites
Lattice strain
Nanoparticles
Variance analysis
X-ray diffraction
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Summary:In this study, the results of x-ray diffraction methods were used to determine the Crystallite size and Lattice strain of Cu2O nanoparticles then to compare the results obtained by using variance analysis method, Scherrer method and Williamson-Hall method. The results of these methods of the same powder which is cuprous oxide, using equations during the determination the crystallite size and lattice strain, It was found that the results obtained the values of the crystallite size (28.302nm) and the lattice strain (0.03541) of the variance analysis method respectively and for the Williamson-Hall method were the results of the crystallite size (21.678nm) and lattice strain (0.00317) respectively, and Scherrer method which gives the value of crystallite size is (16.91908 nm) and lattice strain is (0.007632).
ISSN:0094-243X
1551-7616
DOI:10.1063/5.0171737