A Binary Fast Image Registration Method Based on Fusion Information

In the field of airborne aerial imaging, image stitching is often used to expand the field of view. Registration is the foundation of aerial image stitching and directly affects its success and quality. This article develops a fast binary image registration method based on the characteristics of air...

Full description

Saved in:
Bibliographic Details
Published in:Electronics (Basel) 2023-11, Vol.12 (21), p.4475
Main Authors: Liang, Huaidan, Liu, Chenglong, Li, Xueguang, Wang, Lina
Format: Article
Language:English
Subjects:
Accelerated tests
Accuracy
Aircraft
Algorithms
Aviation
Coordinate transformations
Deep learning
Efficiency
Embedded systems
Image processing
Image registration
Methods
Neighborhoods
Registration
Remote sensing
Sampling methods
Stitching
Success
Citations: Items that this one cites
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:In the field of airborne aerial imaging, image stitching is often used to expand the field of view. Registration is the foundation of aerial image stitching and directly affects its success and quality. This article develops a fast binary image registration method based on the characteristics of airborne aerial imaging. This method first integrates aircraft parameters and calculates the ground range of the image for coarse registration. Then, based on the characteristics of FAST (Features from Accelerated Segment Test), a new sampling method, named Weighted Angular Diffusion Radial Sampling (WADRS), and matching method are designed. The method proposed in this article can achieve fast registration while ensuring registration accuracy, with a running speed that is approximately four times faster than SURF (Speed Up Robust Features). Additionally, there is no need to manually select any control points before registration. The results indicate that the proposed method can effectively complete remote sensing image registration from different perspectives.
ISSN:2079-9292
2079-9292
DOI:10.3390/electronics12214475