Influence of Sm doping on the optical, mechanical, electrical, thermal and z-scan analysis of sulphamic acid single crystal for nonlinear optical device applications

• Published in: Journal of materials science. Materials in electronics 2023-11, Vol.34 (32), p.2153, Article 2153
• Main Authors: Sudhakar, G., Rajan Babu, D.
• Format: Article
• Language: English
• Subjects: Acids; Characterization and Evaluation of Materials; Chemistry and Materials Science; Cooling; Crystal growth; Crystal structure; Cut off wavelength; Diamond pyramid hardness tests; Dielectric properties; Dielectric strength; Influence; Lasers; Materials Science; Nonlinear optics; Optical and Electronic Materials; Optics; Photonics; Refractivity; Samarium; Single crystals; Sulfamic acid; Temperature; Thermal stability; Visible spectrum; X-rays
• ISSN: 0957-4522; 1573-482X
• DOI: 10.1007/s10854-023-11503-6

Samarium-doped Sulphamic acid (Sm: SA) crystals were grown by a gradual cooling process and their purity and structure were confirmed by powder and single-crystal XRD analysis. The UV–visible spectrum revealed that the grown crystals exhibit high optical transparency across the visible range and their cut-off wavelength and band gap were determined. The refractive index, measured for pure and Sm: SA crystals were 1.3600 and 1.4298 using the prism coupling technique, which is vital for understanding light propagation within the crystals. Vickers micro hardness test was carried out to study the mechanical strength. The dielectric property was measured for pure and Sm: SA crystals at different temperatures as a function of frequency. The thermal stability and breakdown behaviour of the crystal were determined by TG/ DT analysis. The Z-scan was analysed for pure and Sm: SA crystals.