Some aspects of resistive-to-normal state transition by direct and microwave currents in superconducting thin films with phase slip lines

Based on analysis of current-voltage characteristics and imaging of the resistive state of thin-film tin strips using the low-temperature laser scanning microscopy (LTLSM), the process of destruction of superconductivity by current and microwave irradiation with the formation and spatial rearrangeme...

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Bibliographic Details
Published in:arXiv.org 2024-01
Main Authors: Turutanov, O G, Sivakov, A G, Leha, A A, Pokhila, A S, Kolinko, A E, Grajcar, M
Format: Article
Language:English
Subjects:
Current voltage characteristics
Low temperature
Order parameters
Scanning microscopy
Superconductivity
Thin films
Online Access:Get full text
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Summary:Based on analysis of current-voltage characteristics and imaging of the resistive state of thin-film tin strips using the low-temperature laser scanning microscopy (LTLSM), the process of destruction of superconductivity by current and microwave irradiation with the formation and spatial rearrangement of the order parameter phase slip lines, and their transformation into discrete localized normal domains is shown. The prospects of LTLSM are considered form the point of view of study of the high-frequency properties of superconducting structures and spatial characteristics in the pre-critical state for instrumental applications.
ISSN:2331-8422