Causal Model Implementation for the Conductor Surface Roughness Effect on the Attenuation and Delay of Microstrip Lines

The conductor surface roughness effect on microstrip lines is physically represented by proposing a step-by-step methodology that uses experimental S -parameters supported by electromagnetic (EM) simulations assuming smooth conductor surfaces. This avoids implementing the microstrip line model by a...

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Bibliographic Details
Published in:IEEE transactions on microwave theory and techniques 2024-01, Vol.72 (1), p.1-0
Main Authors: Serrano-Serrano, Maria T., Torres-Torres, Reydezel
Format: Article
Language:English
Subjects:
Conductors
Delays
Dielectrics
Electromagnetic (EM) simulations
Microstrip
microstrip lines
Microstrip transmission lines
Rough surfaces
S-parameters
Surface impedance
Surface roughness
Surface roughness effects
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Summary:The conductor surface roughness effect on microstrip lines is physically represented by proposing a step-by-step methodology that uses experimental S -parameters supported by electromagnetic (EM) simulations assuming smooth conductor surfaces. This avoids implementing the microstrip line model by arbitrarily fitting simulations with experimental data that include multiple-frequency-dependent effects. Furthermore, a priori knowledge of the roughness profile is not required in this proposal. From the analysis, the peak-to-valley feature of the surface roughness that allows for the representation of the corresponding effect on the electrical response of the lines is obtained. The implemented models show a correlation with experimental data up to 35 GHz.
ISSN:0018-9480
1557-9670
DOI:10.1109/TMTT.2023.3285425