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Elimination of charge accumulation by a self-assembled cocrystal interlayer for efficient and stable perovskite solar cells
Elimination of interfacial charge accumulation and inhibition of ion migration are still challenging for promoting both efficiency and operational stability of perovskite solar cells (PVSCs) with 2,2′,7,7′-tetrakis( N , N -di- p -methoxyphenyl-amine)-9,9′-spiro bifluorene (spiro-OMeTAD). Here an inn...
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Published in: | Energy & environmental science 2024-01, Vol.17 (2), p.569-579 |
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Main Authors: | , , , , , , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
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Summary: | Elimination of interfacial charge accumulation and inhibition of ion migration are still challenging for promoting both efficiency and operational stability of perovskite solar cells (PVSCs) with 2,2′,7,7′-tetrakis(
N
,
N
-di-
p
-methoxyphenyl-amine)-9,9′-spiro bifluorene (spiro-OMeTAD). Here an innovative interface engineering, self-assembled cocrystal layer (SAM-CL) for PVSCs is constructed from a 1-pyrenemethylamine hydrochloride (PRMA) monolayer on the perovskite surface and 2,3,5,6-tetrafluoro-7,7′,8,8′-tetracyanoquinodimethane (F4TCNQ) doped in spiro-OMeTAD through intermolecular π-π interactions and hydrogen bonds. SAM-CL optimizes interfacial energy level alignment by a strong charge-transfer effect, thereby eliminating interfacial charge accumulation. Moreover, the excellent barrier effect of large pyrene rings and fluorine atoms in SAM-CL effectively hinders ion migration and moisture invasion, thus significantly improving the stability of PVSCs. The resulting PVSCs yield a power conversion efficiency (PCE) of 24.03% with a high open circuit voltage of 1.21 V and deliver impressive stability, which can maintain 85% of initial PCE after over 1800 h in air with a relative humidity of 70-80% without encapsulation.
A SAM-CL has been introduced in n-i-p perovskite solar cells to optimize interfacial energy level arrangement and eliminate interfacial charge accumulation. The large pyrene rings and F atoms of SAM-CL inhibit severe ion migration and moisture erosion, thus improving device stability. |
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ISSN: | 1754-5692 1754-5706 |
DOI: | 10.1039/d3ee03550f |