A snake addressing scheme for phase change memory testing

Phase change memory （PCM） is one of the most promising candidates for next generation nonvolatile memory. However, PCM suffers from a variety of faults due to its special device structure and operation mechanism. A snake addressing scheme is introduced into the test algorithms of PCM to reduce the t...

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Bibliographic Details
Published in:Science China. Information sciences 2016-10, Vol.59 (10), p.218-228, Article 102401
Main Authors: Cui, Xiaole, Cheng, Zuolin, Lee, Chunglen, Lin, Xinnan, Wei, Yiqun, Chen, Xiaogang, Song, Zhitang
Format: Article
Language:English
Subjects:
Addressing schemes
Algorithms
Computer memory
Computer Science
Faults
Information Systems and Communication Service
PCM
Research Paper
Testing time
寻址
干扰故障
测试算法
相变存储器
种用
蛇
非易失性存储器
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Summary:Phase change memory （PCM） is one of the most promising candidates for next generation nonvolatile memory. However, PCM suffers from a variety of faults due to its special device structure and operation mechanism. A snake addressing scheme is introduced into the test algorithms of PCM to reduce the test time and excite proximity disturb faults more effectively. The March test algorithm with the proposed snake addressing scheme is less complex than most traditional test algorithms. In addition to conventional faults, it is capable of covering disturb and parasitic faults. Moreover, when incorporated with the sneak path testing method, it is able to test the read fault, read recovery fault, incomplete program fault O, and false write fault.
ISSN:1674-733X
1869-1919
DOI:10.1007/s11432-015-5437-0