Structural, dielectric and a.c. conductivity study of Sb2O3 thin film obtained by thermal oxidation of Sb2S3

This work highlights some physical properties of Sb 2 O 3 thin films obtained through heat treatment of Sb 2 S 3 thin films under an atmospheric pressure at 400°C. The obtained material is characterized by X-ray diffraction and impedance spectroscopy. X-ray diffraction analysis shows that Sb 2 O 3 t...

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Bibliographic Details
Published in:Bulletin of materials science 2016-12, Vol.39 (7), p.1801-1808
Main Authors: LAKHDAR, M HAJ, LARBI, T, KHALFALLAH, B, OUNI, B, AMLOUK, M
Format: Article
Language:English
Subjects:
Antimony trioxide
Chemistry and Materials Science
Crystallization
Dependence
Dielectric properties
Electrical resistivity
Engineering
Frequency ranges
Glass substrates
Grain size
Heat treatment
Impedance spectroscopy
Materials Science
Oxidation
Physical properties
Spectrum analysis
Temperature
Temperature dependence
Thin films
X-ray diffraction
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Summary:This work highlights some physical properties of Sb 2 O 3 thin films obtained through heat treatment of Sb 2 S 3 thin films under an atmospheric pressure at 400°C. The obtained material is characterized by X-ray diffraction and impedance spectroscopy. X-ray diffraction analysis shows that Sb 2 O 3 thin films were crystallized in cubic structure having a preferential growth along (222) plane. The grain size is found to be around 65 nm. The electrical conductivity was studied using impedance spectroscopy technique in the frequency range from 5 Hz to 13 MHz at temperatures lying in 638–698 K domain. Besides, the frequency and temperature dependence of the complex impedance, a.c. conductivity and complex electric modulus have been investigated.
ISSN:0250-4707
0973-7669
DOI:10.1007/s12034-016-1335-3