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Dielectric Properties of Coronene Film Deposited onto Silicon Substrate by Spin Coating for Optoelectronic Applications

To determine the electrical modulus, dielectric properties, and ac conductivity of Coronene semiconductor layer, we have produced Al/Coronene/n-Si structure by using the thermally evaporation and spin coating method. The variation of dielectric constant ( ε ′ ), dielectric imaginary part ( ε ″ ), ta...

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Bibliographic Details
Published in:SILICON 2022-04, Vol.14 (5), p.2201-2209
Main Authors: Akın, Ümmühan, Yüksel, Ömer Faruk, Tuğluoğlu, Nihat
Format: Article
Language:English
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Summary:To determine the electrical modulus, dielectric properties, and ac conductivity of Coronene semiconductor layer, we have produced Al/Coronene/n-Si structure by using the thermally evaporation and spin coating method. The variation of dielectric constant ( ε ′ ), dielectric imaginary part ( ε ″ ), tangent loss ( tanδ ), electrical modulus ( M ′ and M ″ ), and ac electrical conductivity ( σ ac ) with voltage and frequency of Coronene semiconductor layer have been investigated in the frequency range of 1 kHz – 1 MHz and at the selected voltages (0.0–0.4 V with steps 0.02 V). It is found that the ε ′ and ε ″ values decrease with increasing frequency while an increase is observed in tanδ , σ ac , and the real ( M ′ ) and the imaginary ( M ″ ) of the electrical modulus. The ε ′ , ε ″ , tanδ , σ ac , M ′ , and M ″ values have been determined as 6.53, 8.58, 1.31, 0.0477 S/cm, 0.0561 and 0.0477 for 1 kHz and 0.0046, 0.129, 2.78, 7.17 S/cm, 0.278, and 7.74 for 1 MHz at 0.0 V, respectively.
ISSN:1876-990X
1876-9918
DOI:10.1007/s12633-021-01017-3