Effect of 8 MeV electron beam irradiation on the structural, optical and electrical properties of a PANI-MnWO4 nanocomposite

. The effect of 8MeV electron beam irradiation on the structural, optical and electrical properties of a PANI-MnWO 4 nanocomposite synthesized by in situ chemical oxidative polymerization in the presence of MnWO 4 nanoparticles was investigated. The dose-dependent effect of electron irradiation was...

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Bibliographic Details
Published in:European physical journal plus 2019-01, Vol.134 (1), p.42, Article 42
Main Authors: Aloysius Sabu, N., Francis, Xavier, Ganesh, S., Varghese, Thomas
Format: Article
Language:English
Subjects:
Absorption spectroscopy
Applied and Technical Physics
Atomic
Chemical synthesis
Complex Systems
Condensed Matter Physics
Electrical properties
Electron beams
Electron irradiation
Electrons
Infrared analysis
Infrared spectroscopy
Investigations
Irradiation
Mathematical and Computational Physics
Molecular
Nanocomposites
Nanoparticles
Optical and Plasma Physics
Optical properties
Particle size
Physical properties
Physics
Physics and Astronomy
Polyanilines
Polymerization
Radiation
Regular Article
Spectrum analysis
Theoretical
Transmission electron microscopy
X-ray diffraction
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Summary:. The effect of 8MeV electron beam irradiation on the structural, optical and electrical properties of a PANI-MnWO 4 nanocomposite synthesized by in situ chemical oxidative polymerization in the presence of MnWO 4 nanoparticles was investigated. The dose-dependent effect of electron irradiation was studied using various characterization techniques, such as X-ray diffraction, Fourier-transformed infrared spectroscopy, UV-vis absorption spectroscopy and impedance analyser. Systematic investigation based on the results of structural studies confirms that electron beam irradiation induces defects and particle size variation on the PANI-MnWO 4 nanocomposite, which in turn results in improvements in optical absorption, band gap, DC and AC conductivity, and dielectric constant and loss tangent.
ISSN:2190-5444
2190-5444
DOI:10.1140/epjp/i2019-12462-0