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Feasibility of Kelvin probe force microscopy to measure the surface potential decay of polystyrene film due to relative humidity

The feasibility of measuring the surface potential decay of polystyrene (PS) film is investigated at room temperature by using Kelvin probe force microscopy (KPFM). The PS film was charged by an ion injection method utilizing Bruker's atomic force microscope (AFM) Nanoman module with a pulse du...

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Published in:Journal of applied polymer science 2024-03, Vol.141 (10), p.n/a
Main Authors: Jaber, Albraa A., Abu Obaid, Ahmad, Advani, Suresh G., Gillespie, John W.
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Language:English
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Advani, Suresh G.
Gillespie, John W.
description The feasibility of measuring the surface potential decay of polystyrene (PS) film is investigated at room temperature by using Kelvin probe force microscopy (KPFM). The PS film was charged by an ion injection method utilizing Bruker's atomic force microscope (AFM) Nanoman module with a pulse duration of 1 ms, SCM‐PIT electrically conductive probe, and a voltage pulse of −250 mV. The surface potential decayed linearly on a semi‐log scale with time, where the time decay constant was quantified for relative humidity (RH) = 5% by KPFM at room temperature. The surface potential decayed due to the interaction of the PS film with the hydronium ions available in the environment. Furthermore, the effect of the material forms (film vs. microspheres) on the time decay constant at RH = 5% was investigated. The time decay constants measured using different methods exhibited excellent correlation with the AFM‐KPFM. This also confirmed that the results are independent of the material form (microspheres vs. film form). As a result, the proposed method can be used to measure the effect of RH for any PS surface (i.e., particles of various sizes and films) exposed to these environmental conditions.
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The PS film was charged by an ion injection method utilizing Bruker's atomic force microscope (AFM) Nanoman module with a pulse duration of 1 ms, SCM‐PIT electrically conductive probe, and a voltage pulse of −250 mV. The surface potential decayed linearly on a semi‐log scale with time, where the time decay constant was quantified for relative humidity (RH) = 5% by KPFM at room temperature. The surface potential decayed due to the interaction of the PS film with the hydronium ions available in the environment. Furthermore, the effect of the material forms (film vs. microspheres) on the time decay constant at RH = 5% was investigated. The time decay constants measured using different methods exhibited excellent correlation with the AFM‐KPFM. This also confirmed that the results are independent of the material form (microspheres vs. film form). 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subjects AFM‐KPFM
Atomic force microscopy
ATR‐FTIR
charge decay
Decay rate
effects of humidity
Faraday cup
Feasibility
Humidity
Hydronium ions
Ion injection
Microscopy
Microspheres
ozone charging
polystyrene
Polystyrene resins
Pulse duration
Relative humidity
Room temperature
Time measurement
title Feasibility of Kelvin probe force microscopy to measure the surface potential decay of polystyrene film due to relative humidity
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