Structural and Optical Characterization of Chemically Deposited PbS Thin Films

PbS thin films were deposited on glass substrates by a chemical bath deposition method. The effect of varying the film thickness on the structural and optical properties has been investigated. XRD analysis reveals the crystallinity of the deposited PbS films with (200) preferred crystal orientation....

Full description

Saved in:
Bibliographic Details
Published in:SILICON 2017-11, Vol.9 (6), p.809-816
Main Authors: Fouda, A. N., Marzook, M., Abd El-Khalek, H. M., Ahmed, S., Eid, E. A., El Basaty, A. B.
Format: Article
Language:English
Subjects:
Caustic soda
Chemistry
Chemistry and Materials Science
Crystal structure
Crystallinity
Dislocation density
Energy gap
Environmental Chemistry
Film thickness
Glass substrates
Inorganic Chemistry
Lasers
Materials Science
Morphology
Optical Devices
Optical properties
Optics
Original Paper
Photonics
Polymer Sciences
Radiation
Scanning electron microscopy
Science
Semiconductors
Structural analysis
Thin films
X-ray spectroscopy
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:PbS thin films were deposited on glass substrates by a chemical bath deposition method. The effect of varying the film thickness on the structural and optical properties has been investigated. XRD analysis reveals the crystallinity of the deposited PbS films with (200) preferred crystal orientation. Increasing the film thickness enhances the crystallinity of the films as well as decreases the strain and dislocation density. The surface morphology features were dramatically changed from small spherical grains to bead-like shape. The absence of impurities in the deposited films was confirmed by energy dispersive x-ray spectrometry (EDX) measurements. The optical constants of the deposited films were calculated and a small decrease in the band gap energy was observed with increasing the film thickness.
ISSN:1876-990X
1876-9918
DOI:10.1007/s12633-015-9399-z