Stabilization of U 5\(f^2\) configuration in UTe\(_2\) through U 6d dimers in the presence of Te2 chains

We investigate the topological superconductor candidate UTe\(_2\) using high-resolution valence-band resonant inelastic x-ray scattering at the U \(M_{4,5}\)-edges. We observe atomic-like low-energy excitations that support the correlated nature of this unconventional superconductor. These excitatio...

Full description

Saved in:
Bibliographic Details
Published in:arXiv.org 2024-02
Main Authors: Christovam, Denise S, Sundermann, Martin, Marino, Andrea, Takegami, Daisuke, Falke, Johannes, Dolmantas, Paulius, Harder, Manuel, Hlynur Gretarsson amd Bernhard Keimer, Gloskovskii, Andrei, Haverkort, Maurits W, Elfimov, Ilya, Zwicknagl, Gertrud, Andreev, Alexander V, Havela, Ladislav, Bordelon, Mitchell M, Bauer, Eric D, Rosa, Priscila F S, Severing, Andrea, Liu, Hao Tjeng
Format: Article
Language:English
Subjects:
Configurations
Dimers
Excitation
Inelastic scattering
Photoelectric emission
Photoionization
Physical properties
Stabilization
Topological superconductors
Unconventional superconductors
X-ray scattering
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:We investigate the topological superconductor candidate UTe\(_2\) using high-resolution valence-band resonant inelastic x-ray scattering at the U \(M_{4,5}\)-edges. We observe atomic-like low-energy excitations that support the correlated nature of this unconventional superconductor. These excitations originate from the U \(5f^2\) configuration, which is unexpected since the short Te2-Te2 distances exclude Te2 being 2-. By utilizing the photoionization cross-section dependence of the photoemission spectra in combination with band structure calculations, we infer that the stabilization of the U \(5f^2\) configuration is due to the U \(6d\) bonding states in the U-dimers acting as a charge reservoir. Our results emphasize that the description of the physical properties should commence with a \(5f^2\) \(ansatz\).
ISSN:2331-8422