Evaluation of an Analytical Equivalent Hertzian Dipole Representation in TEM Cells applying the Finite Element Method

For the metrological quantification of radiated emissions of integrated circuits, the two-port TEM cell and IC stripline methods are utilized. Analytical formulas have been developed in the past to use the TEM cell measurement for the extraction of an equivalent analytical representation of the meas...

Full description

Saved in:
Bibliographic Details
Published in:IEEE transactions on magnetics 2024-03, Vol.60 (3), p.1-1
Main Authors: Kreindl, Dominik, Bauernfeind, Thomas, Weiss, Bernhard, Stockreiter, Christian, Kaltenbacher, Manfred
Format: Article
Language:English
Subjects:
dipole extraction method
electromagnetic compatibility
Emission analysis
Equivalence
Finite element analysis
Finite element method
Integrated circuit modeling
Integrated circuits
Magnetic dipoles
Magnetic moments
Mathematical analysis
radiated emissions
Representations
Stripline
TEM cells
Vertical cavity surface emitting lasers
Voltage
Citations: Items that this one cites
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:For the metrological quantification of radiated emissions of integrated circuits, the two-port TEM cell and IC stripline methods are utilized. Analytical formulas have been developed in the past to use the TEM cell measurement for the extraction of an equivalent analytical representation of the measured device under test. The equivalent sources are described as an array of electric and magnetic dipoles and can be used for e.g. open-area emission test simulations. This paper summarizes the theoretical background of this extraction methodology and gives an instruction for the needed measurements and calculations. Furthermore, the accuracy of this equivalent source model is evaluated against full-wave finite element simulations and its portability to IC stripline measurements is investigated.
ISSN:0018-9464
1941-0069
DOI:10.1109/TMAG.2023.3324698