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Retraction Note: Capacitance pin defect detection based on deep learning

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Bibliographic Details
Published in:Journal of combinatorial optimization 2024-04, Vol.47 (3), Article 30
Main Authors: Cheng, Cheng, Dai, Ning, Huang, Jie, Zhuang, Yahong, Tang, Tao, Liu, Longlong
Format: Article
Language:English
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ISSN:1382-6905
1573-2886
DOI:10.1007/s10878-024-01130-0