Investigation of the Optical Properties of a BiFeO3/SrTiO3 Heterostructure Grown on an Al2O3(0001) Substrate by RF Cathode Sputtering

The phase composition, structure, and optical properties of the BiFeO 3 /SrTiO 3 /Al 2 O 3 (c-cut) heterostructure have been studied using XRD analysis, spectrophotometry, and multi-angle ellipsometry. BFO/STO/A1 2 O 3 heterostructures have been obtained by high-frequency cathode sputtering in an ox...

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Bibliographic Details
Published in:Optics and spectroscopy 2023-06, Vol.131 (6), p.404-408
Main Authors: Kara-Murza, S. V., Zhidel, K. M., Korchikova, N. V., Silcheva, A. G., Tekhtelev, Yu. V., Chizhov, R. G., Pavlenko, A. V.
Format: Article
Language:English
Subjects:
Aluminum oxide
Boundary layers
Cathode sputtering
Crystallography
Ellipsometry
Heterostructures
Lasers
Optical Devices
Optical properties
Optics
Phase composition
Photonics
Physics
Physics and Astronomy
Refractivity
Spectrophotometry
Strontium titanates
Substrates
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Summary:The phase composition, structure, and optical properties of the BiFeO 3 /SrTiO 3 /Al 2 O 3 (c-cut) heterostructure have been studied using XRD analysis, spectrophotometry, and multi-angle ellipsometry. BFO/STO/A1 2 O 3 heterostructures have been obtained by high-frequency cathode sputtering in an oxygen atmosphere using the intermittent deposition technology. It was found that the BiFeO 3 and SrTiO 3 layers grew with an orientation in the direction of the [111] crystallographic axis parallel to the normal to the Al 2 O 3 substrate. It has been shown that the damaged layer on the surface of the heterostructure does not exceed 2‒3 nm, and no signs of the presence of boundary layers at the Al 2 O 3 –SrTiO 3 and SrTiO 3 –BiFeO 3 interfaces have been identified. The dispersion dependences of the refractive indices of BFO and STO layers are calculated. The reasons for the revealed regularities are discussed.
ISSN:0030-400X
1562-6911
DOI:10.1134/S0030400X2302011X