Rietveld analysis and dielectric spectroscopy of high conductivity and low dielectric loss Co Zn La ferrite

This study investigates structural and dielectric characteristics of Co 0.65 Zn 0.35 La x Fe 2-x O 4 (CZL), with (x = 0, 0.02, 0.04, 0.06, 0.08 and 0.1), synthesized using the flash auto-combustion approach. The Fourier transform infrared spectroscopy supports the X-ray results for forming single-ph...

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Bibliographic Details
Published in:Phase transitions 2024-05, Vol.97 (4-5), p.260-275
Main Authors: Altarawneh, Aseel M., Arrasheed, Enas A., Alibwaini, Yamen A., Ghazy, R., Hemeda, O.M., Henaish, A.M.A., Mostafa, M.
Format: Article
Language:English
Subjects:
Crystallites
Current loss
Dielectric loss
Dielectric properties
Eddy currents
Electrical properties
Electrical resistivity
Ferrites
flash auto combustion method
Fourier transforms
FTIR
grain size
Infrared spectroscopy
Magnetic properties
Nanoparticles
Rietveld refinement
TEM
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Summary:This study investigates structural and dielectric characteristics of Co 0.65 Zn 0.35 La x Fe 2-x O 4 (CZL), with (x = 0, 0.02, 0.04, 0.06, 0.08 and 0.1), synthesized using the flash auto-combustion approach. The Fourier transform infrared spectroscopy supports the X-ray results for forming single-phase spinel structure. The Debye Scherer's formula was used to evaluate the average crystallite size that found within the range of 31.5-46 nm. With increasing La3+ concentration, the lattice parameter, cell volume and density decreased. The formation of nanoparticles was supported by transmission electron microscopy TEM examination, which was coinciding with nanoparticle size from (XRD) data. The sample x = 0.06 has the highest value of resistivity and the lowest dielectric loss. The high value of electrical resistivity in ferrite is suitable for the high frequency application where eddy current losses are appreciable. The dielectric constant decreases with increasing La content, implying that the material's dielectric properties are very useful for electron magnetic wave absorption applications.
ISSN:0141-1594
1029-0338
DOI:10.1080/01411594.2024.2313727