Comparative characterization of structural alignment within turbostratic CVD graphene by means of Raman scattering and allometric scaling

The aim of this study was to investigate the geometrical patterns seen on the surface of chemical vapor deposited (CVD) graphene using fractal analysis of surface topography images obtained from atomic force microscopy (AFM) and scanning electron microscopy (SEM) and refer them to the structural dat...

Full description

Saved in:
Bibliographic Details
Published in:Indian journal of physics 2024-05, Vol.98 (6), p.2153-2161
Main Authors: Ghaderi, Atefeh, Azizi, Behnam, Bramowicz, Miroslaw, Kulesza, Slawomir, Gharebagh, Javad Shoa, Jamilpanah, Loghman, Ţălu, Ştefan, Mohseni, Seyed Majid
Format: Article
Language:English
Subjects:
Astrophysics and Astroparticles
Chemical vapor deposition
Fractal analysis
Graphene
Microscopy
Physics
Physics and Astronomy
Raman spectra
Raman spectroscopy
Short Research Communication
Structural analysis
Citations: Items that this one cites
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:The aim of this study was to investigate the geometrical patterns seen on the surface of chemical vapor deposited (CVD) graphene using fractal analysis of surface topography images obtained from atomic force microscopy (AFM) and scanning electron microscopy (SEM) and refer them to the structural data derived using Raman spectroscopy. From this comparison, an insight into structural properties of prepared samples was possible, and performed analysis helped to obtain a comprehensive understanding of a role of physicochemical processes to the shaping of three-dimensional (3D) microtextured surfaces.
ISSN:0973-1458
0974-9845
DOI:10.1007/s12648-023-02986-4