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An MTBWO Algorithm Based on BiGRU Model
To address the challenge of distinguishing the health status of bearings, in this paper, a health index (HI) is developed through utilization of the multiple target time-varying black widow optimization–bidirectional gating recurrent unit (MTBWO-BiGRU) model and the Bray–Curtis distance. This index...
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Published in: | Electronics (Basel) 2024-04, Vol.13 (7), p.1195 |
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Main Authors: | , , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites |
Online Access: | Get full text |
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Summary: | To address the challenge of distinguishing the health status of bearings, in this paper, a health index (HI) is developed through utilization of the multiple target time-varying black widow optimization–bidirectional gating recurrent unit (MTBWO-BiGRU) model and the Bray–Curtis distance. This index offers a visual representation of the health status of bearings, enabling more intuitive monitoring and prediction. The first step involves utilizing L1 regularization to extract effective features as degradation elements from the current bearing vibration data. Additionally, the characteristics of the initial time window of the vibration data serve as the health features. Next, the HI of the bearing is constructed by computing the Bray–Curtis distance between the bearing’s degradation characteristics and health features. The cloud monitoring platform constantly tracks the health of the bearing and employs the MTBWO-BiGRU model to anticipate the forthcoming state of health. The platform generates an immediate alert when the HI of the bearing overtakes the alteration rate threshold and foresees the condition of the bearing. We compare the MTBWO-BiGRU model with the bidirectional long short-term memory (BiLSTM) and BiGRU models. The results indicate an accuracy level of 92.57%, which is evidently higher than that obtained when using the other two models. Moreover, the MTBWO-BiGRU model is lighter, demonstrating the practicality of the proposed approach. |
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ISSN: | 2079-9292 2079-9292 |
DOI: | 10.3390/electronics13071195 |