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Micro-Pirani Pressure Sensor With Operation Range Beyond Atmospheric Pressure Based on Aligned Carbon Nanotube Films
In this work, we report a micro-Pirani vacuum sensor based on super-aligned carbon nanotube (CNT) films. The devices are batch fabricated on silicon wafers utilizing simple microfabrication process, demonstrating much higher capability of large-scale and efficient parallel manufacturing compared wit...
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Published in: | IEEE electron device letters 2024-05, Vol.45 (5), p.901-904 |
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creator | Wang, Yuwei Liu, Chenxi Qiu, Jun He, Yidan Li, Zhiwei Liu, Peng Wei, Xianlong |
description | In this work, we report a micro-Pirani vacuum sensor based on super-aligned carbon nanotube (CNT) films. The devices are batch fabricated on silicon wafers utilizing simple microfabrication process, demonstrating much higher capability of large-scale and efficient parallel manufacturing compared with the previous reported CNT Pirani sensors. Additionally, owing to the nanoscale diameter and excellent electrical and physical properties of CNT films, the upper pressure operating range is pushed up to several atmospheres ( \approx 2.5\times 10^{5} Pa). And the devices exhibit good performance on reproducibility (standard deviation of < 0.32%) and relatively high accuracy (relative error of 0.39% at 2\times 10^{4} Pa). All these results demonstrate the feasibility of our device as pressure sensors in future. |
doi_str_mv | 10.1109/LED.2024.3381153 |
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The devices are batch fabricated on silicon wafers utilizing simple microfabrication process, demonstrating much higher capability of large-scale and efficient parallel manufacturing compared with the previous reported CNT Pirani sensors. Additionally, owing to the nanoscale diameter and excellent electrical and physical properties of CNT films, the upper pressure operating range is pushed up to several atmospheres (<inline-formula> <tex-math notation="LaTeX">\approx 2.5\times 10^{5} </tex-math></inline-formula>Pa). And the devices exhibit good performance on reproducibility (standard deviation of < 0.32%) and relatively high accuracy (relative error of 0.39% at <inline-formula> <tex-math notation="LaTeX">2\times 10^{4} </tex-math></inline-formula>Pa). All these results demonstrate the feasibility of our device as pressure sensors in future.]]></description><identifier>ISSN: 0741-3106</identifier><identifier>EISSN: 1558-0563</identifier><identifier>DOI: 10.1109/LED.2024.3381153</identifier><identifier>CODEN: EDLEDZ</identifier><language>eng</language><publisher>New York: IEEE</publisher><subject>Atmospheric pressure ; Carbon nanotubes ; Electrical resistance measurement ; Physical properties ; Pirani effect ; Pressure measurement ; pressure sensor ; Pressure sensors ; Resistance ; Semiconductor device measurement ; Silicon ; Substrates ; vacuum ; Wires</subject><ispartof>IEEE electron device letters, 2024-05, Vol.45 (5), p.901-904</ispartof><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2024</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><cites>FETCH-LOGICAL-c245t-8526b5bca0d8fdbe6fe851211a32f868b22d6d1a991e38d020c55e246a3bbbe13</cites><orcidid>0009-0008-1202-1964 ; 0000-0001-9570-3240 ; 0000-0001-7203-8313 ; 0000-0002-1181-9500 ; 0000-0002-5931-9310</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/10478672$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,776,780,27903,27904,54774</link.rule.ids></links><search><creatorcontrib>Wang, Yuwei</creatorcontrib><creatorcontrib>Liu, Chenxi</creatorcontrib><creatorcontrib>Qiu, Jun</creatorcontrib><creatorcontrib>He, Yidan</creatorcontrib><creatorcontrib>Li, Zhiwei</creatorcontrib><creatorcontrib>Liu, Peng</creatorcontrib><creatorcontrib>Wei, Xianlong</creatorcontrib><title>Micro-Pirani Pressure Sensor With Operation Range Beyond Atmospheric Pressure Based on Aligned Carbon Nanotube Films</title><title>IEEE electron device letters</title><addtitle>LED</addtitle><description><![CDATA[In this work, we report a micro-Pirani vacuum sensor based on super-aligned carbon nanotube (CNT) films. The devices are batch fabricated on silicon wafers utilizing simple microfabrication process, demonstrating much higher capability of large-scale and efficient parallel manufacturing compared with the previous reported CNT Pirani sensors. Additionally, owing to the nanoscale diameter and excellent electrical and physical properties of CNT films, the upper pressure operating range is pushed up to several atmospheres (<inline-formula> <tex-math notation="LaTeX">\approx 2.5\times 10^{5} </tex-math></inline-formula>Pa). And the devices exhibit good performance on reproducibility (standard deviation of < 0.32%) and relatively high accuracy (relative error of 0.39% at <inline-formula> <tex-math notation="LaTeX">2\times 10^{4} </tex-math></inline-formula>Pa). All these results demonstrate the feasibility of our device as pressure sensors in future.]]></description><subject>Atmospheric pressure</subject><subject>Carbon nanotubes</subject><subject>Electrical resistance measurement</subject><subject>Physical properties</subject><subject>Pirani effect</subject><subject>Pressure measurement</subject><subject>pressure sensor</subject><subject>Pressure sensors</subject><subject>Resistance</subject><subject>Semiconductor device measurement</subject><subject>Silicon</subject><subject>Substrates</subject><subject>vacuum</subject><subject>Wires</subject><issn>0741-3106</issn><issn>1558-0563</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2024</creationdate><recordtype>article</recordtype><recordid>eNpNkE1PwkAQhjdGExG9e_Cwiefifnd7BAQ1QSF-xONmt53CEmhxtz3w7y2BRE_zTvK8M8mD0C0lA0pJ9jCbPA4YYWLAuaZU8jPUo1LqhEjFz1GPpIImnBJ1ia5iXBNChUhFDzWvPg91svDBVh4vAsTYBsAfUMU64G_frPB8B8E2vq7wu62WgEewr6sCD5ttHXcrCD7_641shAJ36HDjl1UXxza4bn2zVd20DvDUb7bxGl2UdhPh5jT76Gs6-Rw_J7P508t4OEtyJmSTaMmUky63pNBl4UCVoCVllFrOSq20Y6xQBbVZRoHrgjCSSwlMKMudc0B5H90f7-5C_dNCbMy6bkPVvTScCJURnWako8iR6kTEGKA0u-C3NuwNJebg1nRuzcGtObntKnfHigeAf7hItUoZ_wW14nX0</recordid><startdate>20240501</startdate><enddate>20240501</enddate><creator>Wang, Yuwei</creator><creator>Liu, Chenxi</creator><creator>Qiu, Jun</creator><creator>He, Yidan</creator><creator>Li, Zhiwei</creator><creator>Liu, Peng</creator><creator>Wei, Xianlong</creator><general>IEEE</general><general>The Institute of Electrical and Electronics Engineers, Inc. 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The devices are batch fabricated on silicon wafers utilizing simple microfabrication process, demonstrating much higher capability of large-scale and efficient parallel manufacturing compared with the previous reported CNT Pirani sensors. Additionally, owing to the nanoscale diameter and excellent electrical and physical properties of CNT films, the upper pressure operating range is pushed up to several atmospheres (<inline-formula> <tex-math notation="LaTeX">\approx 2.5\times 10^{5} </tex-math></inline-formula>Pa). And the devices exhibit good performance on reproducibility (standard deviation of < 0.32%) and relatively high accuracy (relative error of 0.39% at <inline-formula> <tex-math notation="LaTeX">2\times 10^{4} </tex-math></inline-formula>Pa). All these results demonstrate the feasibility of our device as pressure sensors in future.]]></abstract><cop>New York</cop><pub>IEEE</pub><doi>10.1109/LED.2024.3381153</doi><tpages>4</tpages><orcidid>https://orcid.org/0009-0008-1202-1964</orcidid><orcidid>https://orcid.org/0000-0001-9570-3240</orcidid><orcidid>https://orcid.org/0000-0001-7203-8313</orcidid><orcidid>https://orcid.org/0000-0002-1181-9500</orcidid><orcidid>https://orcid.org/0000-0002-5931-9310</orcidid></addata></record> |
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subjects | Atmospheric pressure Carbon nanotubes Electrical resistance measurement Physical properties Pirani effect Pressure measurement pressure sensor Pressure sensors Resistance Semiconductor device measurement Silicon Substrates vacuum Wires |
title | Micro-Pirani Pressure Sensor With Operation Range Beyond Atmospheric Pressure Based on Aligned Carbon Nanotube Films |
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