Influence of Ti4+ substitution on the structural, magnetic, and dielectric properties of Ni-Cu–Zn ferrite

• Published in: Journal of materials science. Materials in electronics 2024-06, Vol.35 (18), p.1239, Article 1239
• Main Authors: Mojahed, Maryam, Gholizadeh, Ahmad, Dizaji, Hamid Rezagholipour
• Format: Article
• Language: English
• Subjects: Carrier mobility; Characterization and Evaluation of Materials; Chemistry and Materials Science; Current carriers; Dielectric properties; Electrical properties; Electron microscopes; Field emission; Grain boundaries; Magnetic properties; Magnetic saturation; Materials Science; Optical and Electronic Materials; Scanning electron microscopy; Substitutes
• ISSN: 0957-4522; 1573-482X
• DOI: 10.1007/s10854-024-12978-7

Auto-combustion citrate–nitrate method was used to prepare the ferrite samples Ni 0.2 Cu 0.4 Zn 0.4 Fe 2- x Ti x O 4 ( x  = 0.1, 0.2, 0.3, 0.4, 0.5, 0.6) and their microstructural, magnetic, and dielectric properties were investigated. A field emission scanning electron microscope (FE-SEM) and energy dispersive spectroscopy attached to FE-SEM were employed to determine the sample morphology. The saturation magnetization values showed a decreasing trend with increasing tetravalent Ti 4+ ions substitution from 56.17 emu/g for x  = 0.0 to 25.43 emu/g for x  = 0.3, but then increased to 35.42 emu/g with further substitution. Dielectric impedance measurements were conducted to explore the effect of Ti 4+ substitution on the grain boundary resistance and charge carrier mobility. The results showed a decrease in both grain boundary resistance and charge carrier mobility with increasing substitution up to x  = 0.3. This decrease was accompanied by an increase in the real part of the dielectric constant of the samples. However, further substitution reversed these trends, suggesting a complex interplay between the structural and electrical properties of the samples.