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21‐4: The Understanding of Bottom Emission Blue OLED Efficiency, Lifetime Trends and Capacitance Curves with Different EILs
We discuss the effects of different electron injection layers (EILs) (NaF/LiF/Liq/ETL:Li) on the electrical properties, lifetime and capacitance systematically base on the bottom emission blue OLED device in the paper. We can determine the aging speed and initial decay of the OLED device from the ch...
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Published in: | SID International Symposium Digest of technical papers 2024-06, Vol.55 (1), p.268-271 |
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creator | Jia, Wenbin Liu, Xiaoning Li, Feng Wan, Xiang Sun, Li Zheng, Kening Ma, Kaihong Xu, Minghong You, Juanjuan Shih, Huai-Ting Yu, Jianwei |
description | We discuss the effects of different electron injection layers (EILs) (NaF/LiF/Liq/ETL:Li) on the electrical properties, lifetime and capacitance systematically base on the bottom emission blue OLED device in the paper. We can determine the aging speed and initial decay of the OLED device from the characteristics of the capacitance. In the Addition, the mechanism of diverse inorganic electron injection layers resulting in the different characteristics of OLED devices is deeply analyzed. Finally, the cause of lifetime collapse with thicker inorganic EIL (70A) is speculatedfrom the two aspects of ion migration by TOF‐SIMS and electron injection capacity. |
doi_str_mv | 10.1002/sdtp.17506 |
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Finally, the cause of lifetime collapse with thicker inorganic EIL (70A) is speculatedfrom the two aspects of ion migration by TOF‐SIMS and electron injection capacity.</description><identifier>ISSN: 0097-966X</identifier><identifier>EISSN: 2168-0159</identifier><identifier>DOI: 10.1002/sdtp.17506</identifier><language>eng</language><publisher>Campbell: Wiley Subscription Services, Inc</publisher><subject>Blue OLED ; Capacitance ; EIL ; Electrical properties ; Emission ; Initial Decay ; Ion migration ; IVL ; Lifetime Collapse ; Mechanism ; Service life assessment ; TOF-SIMS ; Transient Fluorescence</subject><ispartof>SID International Symposium Digest of technical papers, 2024-06, Vol.55 (1), p.268-271</ispartof><rights>2024 The Society for Information Display</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><cites>FETCH-LOGICAL-c1056-b5f0c008881f234c24523826d66d6cc4919055d4c10ab6eaa37942f63c7758773</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,780,784,27924,27925</link.rule.ids></links><search><creatorcontrib>Jia, Wenbin</creatorcontrib><creatorcontrib>Liu, Xiaoning</creatorcontrib><creatorcontrib>Li, Feng</creatorcontrib><creatorcontrib>Wan, Xiang</creatorcontrib><creatorcontrib>Sun, Li</creatorcontrib><creatorcontrib>Zheng, Kening</creatorcontrib><creatorcontrib>Ma, Kaihong</creatorcontrib><creatorcontrib>Xu, Minghong</creatorcontrib><creatorcontrib>You, Juanjuan</creatorcontrib><creatorcontrib>Shih, Huai-Ting</creatorcontrib><creatorcontrib>Yu, Jianwei</creatorcontrib><title>21‐4: The Understanding of Bottom Emission Blue OLED Efficiency, Lifetime Trends and Capacitance Curves with Different EILs</title><title>SID International Symposium Digest of technical papers</title><description>We discuss the effects of different electron injection layers (EILs) (NaF/LiF/Liq/ETL:Li) on the electrical properties, lifetime and capacitance systematically base on the bottom emission blue OLED device in the paper. We can determine the aging speed and initial decay of the OLED device from the characteristics of the capacitance. In the Addition, the mechanism of diverse inorganic electron injection layers resulting in the different characteristics of OLED devices is deeply analyzed. Finally, the cause of lifetime collapse with thicker inorganic EIL (70A) is speculatedfrom the two aspects of ion migration by TOF‐SIMS and electron injection capacity.</description><subject>Blue OLED</subject><subject>Capacitance</subject><subject>EIL</subject><subject>Electrical properties</subject><subject>Emission</subject><subject>Initial Decay</subject><subject>Ion migration</subject><subject>IVL</subject><subject>Lifetime Collapse</subject><subject>Mechanism</subject><subject>Service life assessment</subject><subject>TOF-SIMS</subject><subject>Transient Fluorescence</subject><issn>0097-966X</issn><issn>2168-0159</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2024</creationdate><recordtype>article</recordtype><recordid>eNp90N9KwzAUBvAgCs7pjU8Q8E7sTNImbbzTruqgMMEOvCtdmriM9Y9J6tiF4CP4jD6JnfVaOHBuft858AFwjtEEI0SubenaCQ4pYgdgRDCLPIQpPwQjhHjoccZejsGJtWuEfD8I-Ah8EPz9-RXcwGwl4aIupbGuqEtdv8JGwbvGuaaCSaWt1U0N7zadhPM0mcJEKS20rMXuCqZaSacrCTMj69LCPg_joi2E7k8JCePOvEsLt9qt4FQrJXvmYDJL7Sk4UsXGyrO_PQaL-ySLH710_jCLb1NPYESZt6QKCYSiKMKK-IEgASV-RFjJ-hEi4JgjSsug18WSyaLwQx4QxXwRhjQKQ38MLoa7rWneOmldvm46U_cvcx9FlDNKedSry0EJ01hrpMpbo6vC7HKM8n29-b7e_LfeHuMBb_VG7v6R-fM0exoyP0glfEU</recordid><startdate>202406</startdate><enddate>202406</enddate><creator>Jia, Wenbin</creator><creator>Liu, Xiaoning</creator><creator>Li, Feng</creator><creator>Wan, Xiang</creator><creator>Sun, Li</creator><creator>Zheng, Kening</creator><creator>Ma, Kaihong</creator><creator>Xu, Minghong</creator><creator>You, Juanjuan</creator><creator>Shih, Huai-Ting</creator><creator>Yu, Jianwei</creator><general>Wiley Subscription Services, Inc</general><scope>AAYXX</scope><scope>CITATION</scope><scope>7SC</scope><scope>7SP</scope><scope>8FD</scope><scope>JQ2</scope><scope>L7M</scope><scope>L~C</scope><scope>L~D</scope></search><sort><creationdate>202406</creationdate><title>21‐4: The Understanding of Bottom Emission Blue OLED Efficiency, Lifetime Trends and Capacitance Curves with Different EILs</title><author>Jia, Wenbin ; Liu, Xiaoning ; Li, Feng ; Wan, Xiang ; Sun, Li ; Zheng, Kening ; Ma, Kaihong ; Xu, Minghong ; You, Juanjuan ; Shih, Huai-Ting ; Yu, Jianwei</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c1056-b5f0c008881f234c24523826d66d6cc4919055d4c10ab6eaa37942f63c7758773</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2024</creationdate><topic>Blue OLED</topic><topic>Capacitance</topic><topic>EIL</topic><topic>Electrical properties</topic><topic>Emission</topic><topic>Initial Decay</topic><topic>Ion migration</topic><topic>IVL</topic><topic>Lifetime Collapse</topic><topic>Mechanism</topic><topic>Service life assessment</topic><topic>TOF-SIMS</topic><topic>Transient Fluorescence</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Jia, Wenbin</creatorcontrib><creatorcontrib>Liu, Xiaoning</creatorcontrib><creatorcontrib>Li, Feng</creatorcontrib><creatorcontrib>Wan, Xiang</creatorcontrib><creatorcontrib>Sun, Li</creatorcontrib><creatorcontrib>Zheng, Kening</creatorcontrib><creatorcontrib>Ma, Kaihong</creatorcontrib><creatorcontrib>Xu, Minghong</creatorcontrib><creatorcontrib>You, Juanjuan</creatorcontrib><creatorcontrib>Shih, Huai-Ting</creatorcontrib><creatorcontrib>Yu, Jianwei</creatorcontrib><collection>CrossRef</collection><collection>Computer and Information Systems Abstracts</collection><collection>Electronics & Communications Abstracts</collection><collection>Technology Research Database</collection><collection>ProQuest Computer Science Collection</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>Computer and Information Systems Abstracts Academic</collection><collection>Computer and Information Systems Abstracts Professional</collection><jtitle>SID International Symposium Digest of technical papers</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Jia, Wenbin</au><au>Liu, Xiaoning</au><au>Li, Feng</au><au>Wan, Xiang</au><au>Sun, Li</au><au>Zheng, Kening</au><au>Ma, Kaihong</au><au>Xu, Minghong</au><au>You, Juanjuan</au><au>Shih, Huai-Ting</au><au>Yu, Jianwei</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>21‐4: The Understanding of Bottom Emission Blue OLED Efficiency, Lifetime Trends and Capacitance Curves with Different EILs</atitle><jtitle>SID International Symposium Digest of technical papers</jtitle><date>2024-06</date><risdate>2024</risdate><volume>55</volume><issue>1</issue><spage>268</spage><epage>271</epage><pages>268-271</pages><issn>0097-966X</issn><eissn>2168-0159</eissn><abstract>We discuss the effects of different electron injection layers (EILs) (NaF/LiF/Liq/ETL:Li) on the electrical properties, lifetime and capacitance systematically base on the bottom emission blue OLED device in the paper. We can determine the aging speed and initial decay of the OLED device from the characteristics of the capacitance. In the Addition, the mechanism of diverse inorganic electron injection layers resulting in the different characteristics of OLED devices is deeply analyzed. Finally, the cause of lifetime collapse with thicker inorganic EIL (70A) is speculatedfrom the two aspects of ion migration by TOF‐SIMS and electron injection capacity.</abstract><cop>Campbell</cop><pub>Wiley Subscription Services, Inc</pub><doi>10.1002/sdtp.17506</doi><tpages>4</tpages></addata></record> |
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subjects | Blue OLED Capacitance EIL Electrical properties Emission Initial Decay Ion migration IVL Lifetime Collapse Mechanism Service life assessment TOF-SIMS Transient Fluorescence |
title | 21‐4: The Understanding of Bottom Emission Blue OLED Efficiency, Lifetime Trends and Capacitance Curves with Different EILs |
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