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Low-jitter DLL applied for two-segment TDC

A low-jitter delay-locked loop (DLL) for high-resolution time-to-digital converter (TDC) is proposed in this study. The generated high accurate and low-jitter outputs with uniformly distributed multiphase clocks directly from the voltage-controlled delay line (VCDL) in DLL are applied to two-segment...

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Published in:IET circuits, devices & systems devices & systems, 2018-01, Vol.12 (1), p.17-24
Main Authors: Wu, Jin, Zhang, Youzhi, Zhao, Rongqi, Zhang, Kunpeng, Zheng, Lixia, Sun, Weifeng
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cited_by cdi_FETCH-LOGICAL-c3967-dc0fe00b62b53b635bad94136d68980b6455b50016f2e4bd94fe517697b81b5a3
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creator Wu, Jin
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description A low-jitter delay-locked loop (DLL) for high-resolution time-to-digital converter (TDC) is proposed in this study. The generated high accurate and low-jitter outputs with uniformly distributed multiphase clocks directly from the voltage-controlled delay line (VCDL) in DLL are applied to two-segment TDC. For reducing the static phase offset in locked state, the charge pump with interior feedback loop is used to achieve a better current matching between the charging and discharging currents. An improved phase detector as well as a differential VCDL excellent in linearity property and noise suppression is utilised for reducing the output clock jitter. Fabricated by TSMC 0.35 μm complementary metal–oxide–semiconductor process, the measurement results show that DLL's frequency locking range is 60–240 MHz, the output clock jitters at 125 MHz are 3.6 ps for root mean square and 35.07 ps for peak-to-peak. By clock period counting and eight-phase discrimination, the resolution of
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The generated high accurate and low-jitter outputs with uniformly distributed multiphase clocks directly from the voltage-controlled delay line (VCDL) in DLL are applied to two-segment TDC. For reducing the static phase offset in locked state, the charge pump with interior feedback loop is used to achieve a better current matching between the charging and discharging currents. An improved phase detector as well as a differential VCDL excellent in linearity property and noise suppression is utilised for reducing the output clock jitter. Fabricated by TSMC 0.35 μm complementary metal–oxide–semiconductor process, the measurement results show that DLL's frequency locking range is 60–240 MHz, the output clock jitters at 125 MHz are 3.6 ps for root mean square and 35.07 ps for peak-to-peak. By clock period counting and eight-phase discrimination, the resolution of &lt;1 ns and maximum range of around 1 μs as well as the differential non-linearity &lt;0.68 LSB and the integration non-linearity within −0.97 to 1.24 LSB are obtained for two-segment TDC.</description><identifier>ISSN: 1751-858X</identifier><identifier>ISSN: 1751-8598</identifier><identifier>EISSN: 1751-8598</identifier><identifier>DOI: 10.1049/iet-cds.2016.0342</identifier><language>eng</language><publisher>Stevenage: The Institution of Engineering and Technology</publisher><subject>charge pump ; charge pump circuits ; Charge pumps ; clock jitter ; clock period counting ; Clocks ; Clocks &amp; watches ; CMOS ; CMOS integrated circuits ; Control theory ; current matching ; Data transmission ; Delay lines ; delay lock loops ; delay-locked loop ; discharging currents ; eight-phase discrimination ; Feedback loops ; frequency 60 MHz to 240 MHz ; Frequency locking ; high-resolution time-to-digital converter ; interior feedback loop ; Linearity ; linearity property ; locked state ; low-jitter DLL ; low-jitter outputs ; mean square error methods ; Noise reduction ; noise suppression ; phase detector ; Phase detectors ; Phase matching ; Research Article ; root mean square ; Segments ; size 0.35 mum ; static phase offset ; time 3.6 ps ; time 35.07 ps ; time-digital conversion ; timing jitter ; TSMC complementary metal–oxide–semiconductor process ; two-segment TDC ; uniformly distributed multiphase clocks ; VCDL ; Vibration ; voltage-controlled delay line</subject><ispartof>IET circuits, devices &amp; systems, 2018-01, Vol.12 (1), p.17-24</ispartof><rights>The Institution of Engineering and Technology</rights><rights>2018 The Institution of Engineering and Technology</rights><rights>Copyright The Institution of Engineering &amp; Technology 2018</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c3967-dc0fe00b62b53b635bad94136d68980b6455b50016f2e4bd94fe517697b81b5a3</citedby><cites>FETCH-LOGICAL-c3967-dc0fe00b62b53b635bad94136d68980b6455b50016f2e4bd94fe517697b81b5a3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://onlinelibrary.wiley.com/doi/pdf/10.1049%2Fiet-cds.2016.0342$$EPDF$$P50$$Gwiley$$H</linktopdf><linktohtml>$$Uhttps://onlinelibrary.wiley.com/doi/full/10.1049%2Fiet-cds.2016.0342$$EHTML$$P50$$Gwiley$$H</linktohtml><link.rule.ids>314,777,781,9736,11543,27905,27906,46033,46457</link.rule.ids><linktorsrc>$$Uhttps://onlinelibrary.wiley.com/doi/abs/10.1049%2Fiet-cds.2016.0342$$EView_record_in_Wiley-Blackwell$$FView_record_in_$$GWiley-Blackwell</linktorsrc></links><search><creatorcontrib>Wu, Jin</creatorcontrib><creatorcontrib>Zhang, Youzhi</creatorcontrib><creatorcontrib>Zhao, Rongqi</creatorcontrib><creatorcontrib>Zhang, Kunpeng</creatorcontrib><creatorcontrib>Zheng, Lixia</creatorcontrib><creatorcontrib>Sun, Weifeng</creatorcontrib><title>Low-jitter DLL applied for two-segment TDC</title><title>IET circuits, devices &amp; systems</title><description>A low-jitter delay-locked loop (DLL) for high-resolution time-to-digital converter (TDC) is proposed in this study. 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By clock period counting and eight-phase discrimination, the resolution of &lt;1 ns and maximum range of around 1 μs as well as the differential non-linearity &lt;0.68 LSB and the integration non-linearity within −0.97 to 1.24 LSB are obtained for two-segment TDC.</description><subject>charge pump</subject><subject>charge pump circuits</subject><subject>Charge pumps</subject><subject>clock jitter</subject><subject>clock period counting</subject><subject>Clocks</subject><subject>Clocks &amp; watches</subject><subject>CMOS</subject><subject>CMOS integrated circuits</subject><subject>Control theory</subject><subject>current matching</subject><subject>Data transmission</subject><subject>Delay lines</subject><subject>delay lock loops</subject><subject>delay-locked loop</subject><subject>discharging currents</subject><subject>eight-phase discrimination</subject><subject>Feedback loops</subject><subject>frequency 60 MHz to 240 MHz</subject><subject>Frequency locking</subject><subject>high-resolution time-to-digital converter</subject><subject>interior feedback loop</subject><subject>Linearity</subject><subject>linearity property</subject><subject>locked state</subject><subject>low-jitter DLL</subject><subject>low-jitter outputs</subject><subject>mean square error methods</subject><subject>Noise reduction</subject><subject>noise suppression</subject><subject>phase detector</subject><subject>Phase detectors</subject><subject>Phase matching</subject><subject>Research Article</subject><subject>root mean square</subject><subject>Segments</subject><subject>size 0.35 mum</subject><subject>static phase offset</subject><subject>time 3.6 ps</subject><subject>time 35.07 ps</subject><subject>time-digital conversion</subject><subject>timing jitter</subject><subject>TSMC complementary metal–oxide–semiconductor process</subject><subject>two-segment TDC</subject><subject>uniformly distributed multiphase clocks</subject><subject>VCDL</subject><subject>Vibration</subject><subject>voltage-controlled delay line</subject><issn>1751-858X</issn><issn>1751-8598</issn><issn>1751-8598</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2018</creationdate><recordtype>article</recordtype><recordid>eNqFkEFLwzAYhoMoOKc_wFvBk0Lml6RJU2_abTooeHCCt9C0iXRsa006xv69KRXxoHjKR_I8X15ehC4JTAjE6W1tOlxWfkKBiAmwmB6hEUk4wZKn8vh7lm-n6Mz7FQDnnIkRusmbPV7VXWdcNM3zqGjbdW2qyDYu6vYN9uZ9Y7ZdtJxm5-jEFmtvLr7OMXqdz5bZE86fHxfZfY5LlooEVyVYA6AF1ZxpwbguqjQmTFRCpjLcx5xrDiGnpSbW4c0aThKRJloSzQs2RlfD3tY1HzvjO7Vqdm4bvlQMUkoTLokMFBmo0jXeO2NV6-pN4Q6KgOorUaESFSpRfSWqryQ4d4Ozr9fm8L-gsukLfZgDMJIE-XqQe-w70WK27KkfTlvZwOJf2L-DfQIEiIET</recordid><startdate>201801</startdate><enddate>201801</enddate><creator>Wu, Jin</creator><creator>Zhang, Youzhi</creator><creator>Zhao, Rongqi</creator><creator>Zhang, Kunpeng</creator><creator>Zheng, Lixia</creator><creator>Sun, Weifeng</creator><general>The Institution of Engineering and Technology</general><general>John Wiley &amp; Sons, Inc</general><scope>AAYXX</scope><scope>CITATION</scope><scope>JQ2</scope></search><sort><creationdate>201801</creationdate><title>Low-jitter DLL applied for two-segment TDC</title><author>Wu, Jin ; Zhang, Youzhi ; Zhao, Rongqi ; Zhang, Kunpeng ; Zheng, Lixia ; Sun, Weifeng</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c3967-dc0fe00b62b53b635bad94136d68980b6455b50016f2e4bd94fe517697b81b5a3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2018</creationdate><topic>charge pump</topic><topic>charge pump circuits</topic><topic>Charge pumps</topic><topic>clock jitter</topic><topic>clock period counting</topic><topic>Clocks</topic><topic>Clocks &amp; watches</topic><topic>CMOS</topic><topic>CMOS integrated circuits</topic><topic>Control theory</topic><topic>current matching</topic><topic>Data transmission</topic><topic>Delay lines</topic><topic>delay lock loops</topic><topic>delay-locked loop</topic><topic>discharging currents</topic><topic>eight-phase discrimination</topic><topic>Feedback loops</topic><topic>frequency 60 MHz to 240 MHz</topic><topic>Frequency locking</topic><topic>high-resolution time-to-digital converter</topic><topic>interior feedback loop</topic><topic>Linearity</topic><topic>linearity property</topic><topic>locked state</topic><topic>low-jitter DLL</topic><topic>low-jitter outputs</topic><topic>mean square error methods</topic><topic>Noise reduction</topic><topic>noise suppression</topic><topic>phase detector</topic><topic>Phase detectors</topic><topic>Phase matching</topic><topic>Research Article</topic><topic>root mean square</topic><topic>Segments</topic><topic>size 0.35 mum</topic><topic>static phase offset</topic><topic>time 3.6 ps</topic><topic>time 35.07 ps</topic><topic>time-digital conversion</topic><topic>timing jitter</topic><topic>TSMC complementary metal–oxide–semiconductor process</topic><topic>two-segment TDC</topic><topic>uniformly distributed multiphase clocks</topic><topic>VCDL</topic><topic>Vibration</topic><topic>voltage-controlled delay line</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Wu, Jin</creatorcontrib><creatorcontrib>Zhang, Youzhi</creatorcontrib><creatorcontrib>Zhao, Rongqi</creatorcontrib><creatorcontrib>Zhang, Kunpeng</creatorcontrib><creatorcontrib>Zheng, Lixia</creatorcontrib><creatorcontrib>Sun, Weifeng</creatorcontrib><collection>CrossRef</collection><collection>ProQuest Computer Science Collection</collection><jtitle>IET circuits, devices &amp; systems</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Wu, Jin</au><au>Zhang, Youzhi</au><au>Zhao, Rongqi</au><au>Zhang, Kunpeng</au><au>Zheng, Lixia</au><au>Sun, Weifeng</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Low-jitter DLL applied for two-segment TDC</atitle><jtitle>IET circuits, devices &amp; systems</jtitle><date>2018-01</date><risdate>2018</risdate><volume>12</volume><issue>1</issue><spage>17</spage><epage>24</epage><pages>17-24</pages><issn>1751-858X</issn><issn>1751-8598</issn><eissn>1751-8598</eissn><abstract>A low-jitter delay-locked loop (DLL) for high-resolution time-to-digital converter (TDC) is proposed in this study. The generated high accurate and low-jitter outputs with uniformly distributed multiphase clocks directly from the voltage-controlled delay line (VCDL) in DLL are applied to two-segment TDC. For reducing the static phase offset in locked state, the charge pump with interior feedback loop is used to achieve a better current matching between the charging and discharging currents. An improved phase detector as well as a differential VCDL excellent in linearity property and noise suppression is utilised for reducing the output clock jitter. Fabricated by TSMC 0.35 μm complementary metal–oxide–semiconductor process, the measurement results show that DLL's frequency locking range is 60–240 MHz, the output clock jitters at 125 MHz are 3.6 ps for root mean square and 35.07 ps for peak-to-peak. By clock period counting and eight-phase discrimination, the resolution of &lt;1 ns and maximum range of around 1 μs as well as the differential non-linearity &lt;0.68 LSB and the integration non-linearity within −0.97 to 1.24 LSB are obtained for two-segment TDC.</abstract><cop>Stevenage</cop><pub>The Institution of Engineering and Technology</pub><doi>10.1049/iet-cds.2016.0342</doi><tpages>8</tpages></addata></record>
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identifier ISSN: 1751-858X
ispartof IET circuits, devices & systems, 2018-01, Vol.12 (1), p.17-24
issn 1751-858X
1751-8598
1751-8598
language eng
recordid cdi_proquest_journals_3092275818
source Wiley-Blackwell Open Access Collection
subjects charge pump
charge pump circuits
Charge pumps
clock jitter
clock period counting
Clocks
Clocks & watches
CMOS
CMOS integrated circuits
Control theory
current matching
Data transmission
Delay lines
delay lock loops
delay-locked loop
discharging currents
eight-phase discrimination
Feedback loops
frequency 60 MHz to 240 MHz
Frequency locking
high-resolution time-to-digital converter
interior feedback loop
Linearity
linearity property
locked state
low-jitter DLL
low-jitter outputs
mean square error methods
Noise reduction
noise suppression
phase detector
Phase detectors
Phase matching
Research Article
root mean square
Segments
size 0.35 mum
static phase offset
time 3.6 ps
time 35.07 ps
time-digital conversion
timing jitter
TSMC complementary metal–oxide–semiconductor process
two-segment TDC
uniformly distributed multiphase clocks
VCDL
Vibration
voltage-controlled delay line
title Low-jitter DLL applied for two-segment TDC
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