Phase retrieval for refraction-enhanced x-ray radiography using a deep neural network

• Published in: Physics of plasmas 2024-09, Vol.31 (9)
• Main Authors: Jiang, S., Landen, O. L., Whitley, H. D., Hamel, S., London, R. A., Sterne, P., Hansen, S. B., Hu, S. X., Collins, G. W., Ping, Y.
• Format: Article
• Language: English
• Subjects: Algorithms; Artificial neural networks; Deep learning; Density; Depth profiling; Fresnel diffraction; Fusion energy; Information retrieval; Integral transforms; Material absorption; Neural networks; Phase contrast; Phase contrast microscopy; Phase retrieval; Physics - Plasma physics; Plasma confinement; Radiographs; Radiography; X ray imagery; X ray refraction; X-ray camera; X-ray radiography
• ISSN: 1070-664X; 1089-7674
• DOI: 10.1063/5.0211331

X-ray refraction-enhanced radiography (RER) or phase contrast imaging is widely used to study internal discontinuities within materials. The resulting radiograph captures both the decrease in intensity caused by material absorption along the x-ray path, as well as the phase shift, which is highly sensitive to gradients in density. A significant challenge lies in effectively analyzing the radiographs to decouple the intensity and phase information and accurately ascertain the density profile. Conventional algorithms often yield ambiguous and unrealistic results due to difficulties in including physical constraints and other relevant information. We have developed an algorithm that uses a deep neural network to address these issues and applied it to extract the detailed density profile from an experimental RER. To generalize the applicability of our algorithm, we have developed a technique that quantitatively evaluates the complexity of the phase retrieval process based on the characteristics of the sample and the configuration of the experiment. Accordingly, this evaluation aids in the selection of the neural network architecture for each specific case. Beyond RER, the model has potential applications for other diagnostics where phase retrieval analysis is required.