Growth, magnetic, and electronic properties of Ni-Zn ferrites thin films

Thin films of Ni-Zn ferrite grown on MgO(111) single crystal substrate were prepared using radiofrequency magnetron sputtering, with a target of nominal composition Ni 0.5 Zn 0.5 Fe 2 O 4 . Subsequently, x-ray diffraction (XRD) was performed, which revealed characteristic reflections of a Ni-Zn ferr...

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Bibliographic Details
Published in:Materials research express 2024-09, Vol.11 (9), p.96403
Main Authors: Guzman, L G, Sánchez, L C, Gil Monsalve, J, Ostos, C, Arnache, O
Format: Article
Language:English
Subjects:
Coercivity
Coplanar waveguides
Crystal growth
Electronic properties
Ferromagnetic resonance
Ferromagnetism
Magnetic properties
Magnetic saturation
Magnetron sputtering
Ni-Zn ferrite
Photoelectrons
Radio frequency
Single crystals
Substrates
Thin films
Valence
X ray photoelectron spectroscopy
Zinc ferrites
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Summary:Thin films of Ni-Zn ferrite grown on MgO(111) single crystal substrate were prepared using radiofrequency magnetron sputtering, with a target of nominal composition Ni 0.5 Zn 0.5 Fe 2 O 4 . Subsequently, x-ray diffraction (XRD) was performed, which revealed characteristic reflections of a Ni-Zn ferrite structure, confirming the unique formation of the ferrite. X-ray photoelectron spectroscopy (XPS) revealed the presence of metal ions in their appropriate valence states within the crystalline structure of the Ni-Zn ferrite. The variation in binding energy observed in the thin film is attributed to changes in the environment of Fe 3+ and Zn 2+ or Ni 2+ ions, resulting from the non-equilibrium distribution of cations in tetrahedral and octahedral sites. The saturation magnetization and the coercivity field were 7.05 μ B / cell and 513 ± 32 Oe, respectively. In addition, ferromagnetic resonance studies were made using broad-band FMR spectroscopy based on a coplanar waveguide (CPW) spectrometer.
ISSN:2053-1591
2053-1591
DOI:10.1088/2053-1591/ad78ae