MnBi2Te4 Thin-Film Photodetector with a Millisecond Response Speed and Long-Term Air Stability

Topological materials with well-defined surfaces and edges have become a prominent research topic. As topological insulators, MnBi2Te4 thin films, with their unique surfaces, exhibit exceptional electron transport properties and good applicability in low-noise, high-sensitivity photoelectric detecti...

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Bibliographic Details
Published in:Coatings (Basel) 2024-09, Vol.14 (9), p.1134
Main Authors: Yang, Ming, Ren, Haotian, Deng, Wenze, Chang, Haoliang, Li, Qiqin, Zhou, Hongxi, Tu, Xiaoguang, Zhong, Mian, Li, Fei, Zhu, Xinyu
Format: Article
Language:English
Subjects:
Crystal structure
Electron transport
Light
Morphology
Noise sensitivity
Performance degradation
Photoelectricity
Photometers
R&D
Research & development
Room temperature
Scanning electron microscopy
Spectrum analysis
Surface stability
Thin films
Topological insulators
Transport properties
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Summary:Topological materials with well-defined surfaces and edges have become a prominent research topic. As topological insulators, MnBi2Te4 thin films, with their unique surfaces, exhibit exceptional electron transport properties and good applicability in low-noise, high-sensitivity photoelectric detection. This paper reports a straightforward, efficient, and cost-effective thermal evaporation method for preparing quantum MnBi2Te4 thin films, along with an investigation into their photoelectric detection performance. These films can be used to fabricate array devices, with the resulting photodetectors achieving a response current of 97 mA W−1 at room temperature and a response speed of 30 d, with the photoelectric performance degrading by
ISSN:2079-6412
2079-6412
DOI:10.3390/coatings14091134