Accurate simulation of the European XFEL scintillating screens point spread function

The European XFEL is equipped with scintillating screens as a profile measurement monitor. The scintillating material used is Gadolinium Aluminium Gallium Garnet doped with Cerium (GAGG:Ce). At most of the stations, the screen is positioned perpendicular to the electron beam, with scintillation obse...

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Published in:arXiv.org 2024-12
Main Author: Novokshonov, A
Format: Article
Language:English
Subjects:
Cerium
Electron beams
Gadolinium
Gallium
Gaussian beams (optics)
Particle tracking
Point spread functions
Profile measurement
Scintillation counters
Screens
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description The European XFEL is equipped with scintillating screens as a profile measurement monitor. The scintillating material used is Gadolinium Aluminium Gallium Garnet doped with Cerium (GAGG:Ce). At most of the stations, the screen is positioned perpendicular to the electron beam, with scintillation observed at a backward angle. The scintillator thickness is usually 200 um, making the resolution worse in the plane with the angle, as it allows for the entire particle track within the scintillator to be seen. Besides, aberrations are introduced by the objective used. This study outlines an accurate simulation of the point spread function (PSF) caused by all distortions of the optical system and, in addition, a method to improve the screens resolution by including the PSF into a fitting function, assuming a Gaussian beam shape.
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fullrecord <record><control><sourceid>proquest</sourceid><recordid>TN_cdi_proquest_journals_3124869170</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>3124869170</sourcerecordid><originalsourceid>FETCH-proquest_journals_31248691703</originalsourceid><addsrcrecordid>eNqNjMsKwjAURIMgWLT_cMF1IU36cinS4sJlF-5KiKmm1CTmJv9vC36Aq2HmHGZDEsZ5njUFYzuSIk6UUlbVrCx5QvqzlNGLoAD1O84iaGvAjhBeCtrorVPCwL1rb4BSm6DnVTHPpXmlDIKzywrovBIPGKOR68GBbEcxo0p_uSfHru0v18x5-4kKwzDZ6M2CBp6zoqlOeU35f9YXo51A0w</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>3124869170</pqid></control><display><type>article</type><title>Accurate simulation of the European XFEL scintillating screens point spread function</title><source>Publicly Available Content (ProQuest)</source><creator>Novokshonov, A</creator><creatorcontrib>Novokshonov, A</creatorcontrib><description>The European XFEL is equipped with scintillating screens as a profile measurement monitor. The scintillating material used is Gadolinium Aluminium Gallium Garnet doped with Cerium (GAGG:Ce). At most of the stations, the screen is positioned perpendicular to the electron beam, with scintillation observed at a backward angle. The scintillator thickness is usually 200 um, making the resolution worse in the plane with the angle, as it allows for the entire particle track within the scintillator to be seen. Besides, aberrations are introduced by the objective used. This study outlines an accurate simulation of the point spread function (PSF) caused by all distortions of the optical system and, in addition, a method to improve the screens resolution by including the PSF into a fitting function, assuming a Gaussian beam shape.</description><identifier>EISSN: 2331-8422</identifier><language>eng</language><publisher>Ithaca: Cornell University Library, arXiv.org</publisher><subject>Cerium ; Electron beams ; Gadolinium ; Gallium ; Gaussian beams (optics) ; Particle tracking ; Point spread functions ; Profile measurement ; Scintillation counters ; Screens</subject><ispartof>arXiv.org, 2024-12</ispartof><rights>2024. This work is published under http://creativecommons.org/publicdomain/zero/1.0/ (the “License”). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License.</rights><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://www.proquest.com/docview/3124869170?pq-origsite=primo$$EHTML$$P50$$Gproquest$$Hfree_for_read</linktohtml><link.rule.ids>780,784,25753,37012,44590</link.rule.ids></links><search><creatorcontrib>Novokshonov, A</creatorcontrib><title>Accurate simulation of the European XFEL scintillating screens point spread function</title><title>arXiv.org</title><description>The European XFEL is equipped with scintillating screens as a profile measurement monitor. The scintillating material used is Gadolinium Aluminium Gallium Garnet doped with Cerium (GAGG:Ce). At most of the stations, the screen is positioned perpendicular to the electron beam, with scintillation observed at a backward angle. The scintillator thickness is usually 200 um, making the resolution worse in the plane with the angle, as it allows for the entire particle track within the scintillator to be seen. Besides, aberrations are introduced by the objective used. This study outlines an accurate simulation of the point spread function (PSF) caused by all distortions of the optical system and, in addition, a method to improve the screens resolution by including the PSF into a fitting function, assuming a Gaussian beam shape.</description><subject>Cerium</subject><subject>Electron beams</subject><subject>Gadolinium</subject><subject>Gallium</subject><subject>Gaussian beams (optics)</subject><subject>Particle tracking</subject><subject>Point spread functions</subject><subject>Profile measurement</subject><subject>Scintillation counters</subject><subject>Screens</subject><issn>2331-8422</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2024</creationdate><recordtype>article</recordtype><sourceid>PIMPY</sourceid><recordid>eNqNjMsKwjAURIMgWLT_cMF1IU36cinS4sJlF-5KiKmm1CTmJv9vC36Aq2HmHGZDEsZ5njUFYzuSIk6UUlbVrCx5QvqzlNGLoAD1O84iaGvAjhBeCtrorVPCwL1rb4BSm6DnVTHPpXmlDIKzywrovBIPGKOR68GBbEcxo0p_uSfHru0v18x5-4kKwzDZ6M2CBp6zoqlOeU35f9YXo51A0w</recordid><startdate>20241209</startdate><enddate>20241209</enddate><creator>Novokshonov, A</creator><general>Cornell University Library, arXiv.org</general><scope>8FE</scope><scope>8FG</scope><scope>ABJCF</scope><scope>ABUWG</scope><scope>AFKRA</scope><scope>AZQEC</scope><scope>BENPR</scope><scope>BGLVJ</scope><scope>CCPQU</scope><scope>DWQXO</scope><scope>HCIFZ</scope><scope>L6V</scope><scope>M7S</scope><scope>PIMPY</scope><scope>PQEST</scope><scope>PQQKQ</scope><scope>PQUKI</scope><scope>PRINS</scope><scope>PTHSS</scope></search><sort><creationdate>20241209</creationdate><title>Accurate simulation of the European XFEL scintillating screens point spread function</title><author>Novokshonov, A</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-proquest_journals_31248691703</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2024</creationdate><topic>Cerium</topic><topic>Electron beams</topic><topic>Gadolinium</topic><topic>Gallium</topic><topic>Gaussian beams (optics)</topic><topic>Particle tracking</topic><topic>Point spread functions</topic><topic>Profile measurement</topic><topic>Scintillation counters</topic><topic>Screens</topic><toplevel>online_resources</toplevel><creatorcontrib>Novokshonov, A</creatorcontrib><collection>ProQuest SciTech Collection</collection><collection>ProQuest Technology Collection</collection><collection>Materials Science &amp; Engineering Collection</collection><collection>ProQuest Central (Alumni Edition)</collection><collection>ProQuest Central</collection><collection>ProQuest Central Essentials</collection><collection>ProQuest Central</collection><collection>Technology Collection</collection><collection>ProQuest One Community College</collection><collection>ProQuest Central Korea</collection><collection>SciTech Premium Collection</collection><collection>ProQuest Engineering Collection</collection><collection>Engineering Database</collection><collection>Publicly Available Content (ProQuest)</collection><collection>ProQuest One Academic Eastern Edition (DO NOT USE)</collection><collection>ProQuest One Academic</collection><collection>ProQuest One Academic UKI Edition</collection><collection>ProQuest Central China</collection><collection>Engineering Collection</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Novokshonov, A</au><format>book</format><genre>document</genre><ristype>GEN</ristype><atitle>Accurate simulation of the European XFEL scintillating screens point spread function</atitle><jtitle>arXiv.org</jtitle><date>2024-12-09</date><risdate>2024</risdate><eissn>2331-8422</eissn><abstract>The European XFEL is equipped with scintillating screens as a profile measurement monitor. The scintillating material used is Gadolinium Aluminium Gallium Garnet doped with Cerium (GAGG:Ce). At most of the stations, the screen is positioned perpendicular to the electron beam, with scintillation observed at a backward angle. The scintillator thickness is usually 200 um, making the resolution worse in the plane with the angle, as it allows for the entire particle track within the scintillator to be seen. Besides, aberrations are introduced by the objective used. This study outlines an accurate simulation of the point spread function (PSF) caused by all distortions of the optical system and, in addition, a method to improve the screens resolution by including the PSF into a fitting function, assuming a Gaussian beam shape.</abstract><cop>Ithaca</cop><pub>Cornell University Library, arXiv.org</pub><oa>free_for_read</oa></addata></record>
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subjects Cerium
Electron beams
Gadolinium
Gallium
Gaussian beams (optics)
Particle tracking
Point spread functions
Profile measurement
Scintillation counters
Screens
title Accurate simulation of the European XFEL scintillating screens point spread function
url http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-08T01%3A39%3A48IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest&rft_val_fmt=info:ofi/fmt:kev:mtx:book&rft.genre=document&rft.atitle=Accurate%20simulation%20of%20the%20European%20XFEL%20scintillating%20screens%20point%20spread%20function&rft.jtitle=arXiv.org&rft.au=Novokshonov,%20A&rft.date=2024-12-09&rft.eissn=2331-8422&rft_id=info:doi/&rft_dat=%3Cproquest%3E3124869170%3C/proquest%3E%3Cgrp_id%3Ecdi_FETCH-proquest_journals_31248691703%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_pqid=3124869170&rft_id=info:pmid/&rfr_iscdi=true