Recent Progress and Applications of NanoIR‐AFM in Morphological Characterization of Organic Solar Cells

Organic solar cells (OSCs) are gaining attention in building‐integrated and agricultural photovoltaics due to their light weight, mechanical flexibility, and low‐cost solution processability. To achieve commercial viability, understanding the relationships between active layer material structure, fi...

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Bibliographic Details
Published in:Advanced functional materials 2024-12, Vol.34 (49), p.n/a
Main Authors: Wei, Xuewen, Jia, Longfei, Duan, Bowen, Wang, Xinzhou, Du, Liting, Li, Sunsun, Xu, Zhaoyang, Zhao, Wenchao
Format: Article
Language:English
Subjects:
active layer
Atomic force microscopy
Atomic properties
Morphology
n‐type organic semiconductor
organic solar cells
Photovoltaic cells
p‐type organic semiconductor
Solar cells
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Summary:Organic solar cells (OSCs) are gaining attention in building‐integrated and agricultural photovoltaics due to their light weight, mechanical flexibility, and low‐cost solution processability. To achieve commercial viability, understanding the relationships between active layer material structure, film morphology, and photovoltaic performance is crucial. Nanoscale infrared spectroscopy coupled with atomic force microscopy (nanoIR‐AFM) offers an advanced characterization of active layer morphology at high resolution to help understand OSC performance. This review outlines recent developments and applications of nanoIR‐AFM in OSC research, detailing its principles, instruments, and functions. Strategies to enhance OSC performance and their morphological characterization by nanoIR‐AFM are discussed, offering insights into active layer evolution and device performance. The review highlights challenges faced by nanoIR‐AFM in OSC applications and highlights its potential role in advancing OSC technology. As nanoIR‐AFM continues to evolve, it will play a critical role in OSC development, providing essential technical means for further progress. Atomic force microscope‐based nanoscale infrared spectroscopy (NanoIR‐AFM) excels in nanoscale chemical characterization. This review explores the principles and advantages of nanoIR‐AFM, emphasizing its use in analyzing the active layer morphology of organic solar cells (OSCs). Applications of nanoIR‐AFM can help researchers deeply understand the relationships between the characterization, morphology, and performance of photoactive materials and promote the performance of OSCs.
ISSN:1616-301X
1616-3028
DOI:10.1002/adfm.202408960