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Parallel Resonant Loss Characterization of High-Frequency Magnetic Components
We propose a method to characterize losses in inductors and transformers especially suited for high operating frequencies ( {\geq }500 kHz). The proposed technique uses parallel resonance to directly measure the loss, i.e., the real component of a structure's complex impedance. The scheme uniq...
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Published in: | IEEE journal of emerging and selected topics in power electronics 2024-12, Vol.12 (6), p.5696-5704 |
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Main Authors: | , , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites |
Online Access: | Get full text |
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Summary: | We propose a method to characterize losses in inductors and transformers especially suited for high operating frequencies ( {\geq }500 kHz). The proposed technique uses parallel resonance to directly measure the loss, i.e., the real component of a structure's complex impedance. The scheme uniquely allows for testing low-impedance devices under tests (DUTs) at high drive currents, enabling a more complete characterization of magnetic materials and components. We describe the method, analyze error mechanisms, and experimentally validate the method against alternative resonant techniques. |
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ISSN: | 2168-6777 2168-6785 |
DOI: | 10.1109/JESTPE.2024.3463537 |